WEBINAR: Analog Verification and Characterization with Monte Carlo and High-Sigma Analysis

Semiconductor companies designing ICs for smart phones, automotive and industrial applications, CPUs, GPUs and memory components all employ teams of custom IC designers to create the highest performance chips that are as small as possible, and at the lowest costs. Designers must verify and characterize their IP’s sensitivity to random parametric variations in the manufacturing process (both on-chip variation and die-to-die variation), as it can have a large impact on a circuit’s performance or even cause functional failures. Accuracy and efficiency of statistical analysis techniques is a main topic of interest here because many methods may require a large simulation effort.