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Prevent and Eliminate IR Drop and Power Integrity Issues Using RedHawk Analysis Fusion

Prevent and Eliminate IR Drop and Power Integrity Issues Using RedHawk Analysis Fusion
by Mike Gianfagna on 03-24-2020 at 10:00 am

Screen Shot 2020 03 14 at 5.36.37 PM

I had the opportunity to preview an upcoming SemiWiki webinar on IR drop and power integrity. These topics, all by themselves, have real stopping power. Almost everyone I speak with has a story to tell about these issues in a recent chip design project. When you combine hot topics like this with a presentation that details the collaboration… Read More


Reliability Challenges in Advanced Packages and Boards

Reliability Challenges in Advanced Packages and Boards
by Herb Reiter on 03-02-2020 at 10:00 am

CTE Stress ANSYS SemiWiki

Today’s Market Requirements
Complex electronic devices and (sub)systems work for us in important applications, such as aircrafts, trains, trucks, passenger vehicles as well as building infrastructure, manufacturing equipment, medical systems and more. Very high reliability (the ability of a product to meet all requirements… Read More


Thermal Issues and Solutions for 3D ICs: Latest Updates and Future Prospect

Thermal Issues and Solutions for 3D ICs: Latest Updates and Future Prospect
by Mike Gianfagna on 02-26-2020 at 10:00 am

2D vs. 3D heat maps

At DesignCon 2020, ANSYS held a series of sponsored presentations. I was able to attend a couple of them.  These were excellent events with the material delivered by talented and high-energy speakers. The DesignCon technical program has many dimensions beyond the conference tracks. One of the presentations dealt with 3D ICs.… Read More


Thermal Reliability Challenges in Automotive and Data Center Applications – A Xilinx Perspective

Thermal Reliability Challenges in Automotive and Data Center Applications – A Xilinx Perspective
by Bernard Murphy on 02-13-2020 at 6:00 am

thermometer

I wrote recently on ANSYS and TSMC’s joint work on thermal reliability workflows, as these become much more important in advanced processes and packaging. Xilinx provided their own perspective on thermal reliability analysis for their unquestionably large systems – SoC, memory, SERDES and high-speed I/O – stacked within a … Read More


De-Risking High-Speed RF Designs from Electromagnetic Crosstalk Issue

De-Risking High-Speed RF Designs from Electromagnetic Crosstalk Issue
by Mike Gianfagna on 02-12-2020 at 6:00 am

Picture3 1

At DesignCon 2020, ANSYS sponsored a series of very high-quality presentations.  Some focused on advanced methods and new technology exploration and some provided head-on, practical and actionable capabilities to improve advanced designs. The presentation I will discuss here falls into the latter category. The topic was… Read More


Emerging Requirements for Electromagnetic Crosstalk Analysis

Emerging Requirements for Electromagnetic Crosstalk Analysis
by Tom Dillinger on 02-10-2020 at 10:00 am

EM coupling wire segments

This article will describe the motivations for pursuing a new flow in the SoC design methodology.  This flow involves the extraction, evaluation, and analysis of a full electromagnetic coupling model for a complex SoC and its package environment.  The results of this analysis highlight the impact of electromagnetic coupling… Read More


ANSYS, TSMC Document Thermal Reliability Guidelines

ANSYS, TSMC Document Thermal Reliability Guidelines
by Bernard Murphy on 01-01-2020 at 6:00 am

Automotive Reliability Guide min

Advanced IC technologies, 5nm and 7nm FinFET design and stacked packaging, are enabling massive levels of integration of super-fast circuits. These in turn enable much of the exciting new technology we hear so much about: mobile gaming and ultra-high definition mobile video through enhanced mobile broadband in 5G, which requires… Read More


Package Reliability Issues Cost Money

Package Reliability Issues Cost Money
by Tom Dillinger on 11-13-2019 at 6:00 am

Advanced packaging technology is enabling “More Than Moore” scaling of heterogeneous technology die.  At the recent EDPS Symposium in Milpitas, Craig Hillman, Director of Product Development, DfR Solutions, at ANSYS gave a compelling presentation, “Reliability Challenges in Advanced Packaging”.  The key takeaway messages… Read More


5G Deployments – The Analysis Requirements are Ginormous

5G Deployments – The Analysis Requirements are Ginormous
by Tom Dillinger on 10-07-2019 at 10:00 am

The introduction of 5G communications support offers tremendous potential across a broad spectrum of applications (no pun intended).  5G is indeed quite encompassing, across a wide range of frequencies – the figure below illustrates the common terminology used, from low-band, mid-band (“sub 6G”), and high-band (“mmWave… Read More


Xilinx on ANSYS Elastic Compute for Timing and EM/IR

Xilinx on ANSYS Elastic Compute for Timing and EM/IR
by Bernard Murphy on 08-20-2019 at 5:00 am

RedHawk-SC

I’m a fan of getting customer reality checks on advanced design technologies. This is not so much because vendors put the best possible spin on their product capabilities; of course they do (within reason), as does every other company aiming to stay in business. But application by customers on real designs often shows lower performance,… Read More