IC reliability is an issue that circuit design engineers and reliability engineers are concerned about, because physical effects like high Current Density (CD) in interconnect layers, or high point-to-point (P2P) resistance on device interconnect can impact reliability, timing or Electrostatic Discharge (ESD) robustness.… Read More

Very Short Reach (VSR) Connectivity for Optical Modules
Bandwidth, latency, power and reach are always the key points of focus when it comes to connectivity. As the demand for more data and higher bandwidth connectivity continue, power management is gaining a lot of attention. There is renewed interest in pursuing silicon photonics to address many of these challenges. There are many… Read More
[WEBINAR] Secure your devices with PUF plus hardware root-of-trust
It’s a hostile world we live in, and cybersecurity of connected devices is a big concern. Attacks are rising rapidly, and vulnerabilities get exploited immediately. Supply chains are complex. Regulations are proliferating. Secrets don’t stay secrets for long – in fact, the only secret in a system with open-source algorithms… Read More
Refined Fault Localization through Learning. Innovation in Verification
This is another look at refining the accuracy of fault localization. Once a bug has been detected, such techniques aim to pin down the most likely code locations for a root cause. Paul Cunningham (GM, Verification at Cadence), Raúl Camposano (Silicon Catalyst, entrepreneur, former Synopsys CTO and now Silvaco CTO) and I continue… Read More
3D IC Update from User2User
Our smart phones, tablets, laptops and desktops are the most common consumer products with advanced 2.5D and 3D IC packaging techniques. I love seeing the product tear down articles to learn how advanced packaging techniques are being used, so at the User2User conference in Santa Clara I attended a presentation from Tarek Ramadan,… Read More
Sensing – Who needs it?
In a simple answer – everyone. A keynote presentation “Sensing the Unknowns and Managing Power” by Mahesh Tirupattur, the Executive Vice President at Analog Bits at the recent Siemens User2User conference, discussed the need and application of sensors in computing and power applications. Why sense? As Mahesh explains, sensing… Read More
Unlocking PA design with predictive DPD
Next up in this series on modulated signals is an example of multi-dimensional EM design challenges: RF power amplifiers (PAs). Digital pre-distortion (DPD) is a favorite technique for linearizing PA performance. Static effects are easy to model and correct, but PAs are notorious for interrelated dynamic effects spoiling … Read More
Protecting High-Speed Interfaces in Data Centers with Security IP
The never ending appetite for higher bandwidths, faster data interfaces and lower latencies are bringing about changes in how data is processed at data centers. The expansion of cloud to the network edge has introduced broad use of artificial intelligence (AI) techniques for extracting meaning from data. Cloud supercomputing… Read More
Double Diffraction in EUV Masks: Seeing Through The Illusion of Symmetry
At this year’s SPIE Advanced Lithography conference, changes to EUV masks were particularly highlighted, as a better understanding of their behavior is becoming clear. It’s now confirmed that a seemingly symmetric EUV mask absorber pattern does not produce a symmetric image at the wafer, as a conventional DUV … Read More
Take a Leap of Certainty at DAC 2022
The live events I have attended thus far this year have been very good. As much as I liked the virtual events, attending in the comfort of my home or sailboat, it is great to be live and networking inside the semiconductor ecosystem, absolutely.
Ansys has been a great supporter of the Design Automation Conference but this year they … Read More
Semiconductor Crash Update