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Methods for Current Density and Point-to-point Resistance Calculations

Methods for Current Density and Point-to-point Resistance Calculations
by Daniel Payne on 05-26-2022 at 10:00 am

ESD path min

IC reliability is an issue that circuit design engineers and reliability engineers are concerned about, because physical effects like high Current Density (CD) in interconnect layers, or high point-to-point (P2P) resistance on device interconnect can impact reliability, timing or Electrostatic Discharge (ESD) robustness.… Read More


3D IC Update from User2User

3D IC Update from User2User
by Daniel Payne on 05-24-2022 at 10:00 am

FO WLP min

Our smart phones, tablets, laptops and desktops are the most common consumer products with advanced 2.5D and 3D IC packaging techniques. I love seeing the product tear down articles to learn how advanced packaging techniques are being used, so at the User2User conference in Santa Clara I attended a presentation from Tarek Ramadan,… Read More


Joseph Sawicki of Siemens EDA at User2User

Joseph Sawicki of Siemens EDA at User2User
by Daniel Payne on 05-19-2022 at 10:00 am

Joseph Sawicki

I attended the annual user group meeting called User2User in Santa Clara this year, hosted by Siemens EDA, with 51 presentations by customers in 11 tracks, and keynotes during each lunch hour from semiconductor executives. Joseph Sawicki, Executive VP, IC Segment, at Siemens EDA presented on a Tuesday, along with Prashant Varshney,… Read More


Cybersecurity Threat Detection and Mitigation

Cybersecurity Threat Detection and Mitigation
by Daniel Payne on 05-16-2022 at 10:00 am

Embedded Analytics min

Every week in the technology trade press I am reading about cybersecurity attacks against web sites, apps, IoT devices, vehicles and even ICs. At the recent IP SoC Silicon Valley 2022 event in April I watched a cybersecurity  presentation from Robert Rand, Solution Architect for Tessent Embedded Analytics at Siemens EDA. Common… Read More


Efficient Memory BIST Implementation

Efficient Memory BIST Implementation
by Daniel Payne on 05-05-2022 at 10:00 am

Figure 1 min

Test experts use the acronym BIST for Built In Self Test, it’s the test logic added to an IP block that speeds up the task of testing by creating stimulus and then looking at the output results. Memory IP is a popular category for SoC designers, as modern chips include multiple memory blocks for fast, local data and register storage… Read More


Designing a FinFET Test Chip for Radiation Threats

Designing a FinFET Test Chip for Radiation Threats
by Tom Simon on 04-04-2022 at 10:00 am

Charged Particles

Much of the technology that goes into aerospace applications is some of the most advanced technology that exists. However, these same systems must also offer the highest level of reliability in what is arguably an extremely difficult environment. For semiconductors a major environmental risk in aerospace applications are … Read More


Path Based UPF Strategies Explained

Path Based UPF Strategies Explained
by Tom Simon on 03-29-2022 at 6:00 am

Path Based UPF Semantics

The development of the Unified Power Format (UPF) was spurred on by the need for explicit ways to enable specification and verification of power management aspects of SoC designs. The origins of UPF date back to its first release in 2007. Prior to that several vendors had their own methods of specifying power management aspects … Read More


Co-Developing IP and SoC Bring Up Firmware with PSS

Co-Developing IP and SoC Bring Up Firmware with PSS
by Kalar Rajendiran on 03-22-2022 at 10:00 am

Creating a Driver

With ever challenging time to market requirements, co-developing IP and firmware is imperative for all system development projects. But that doesn’t make the task any easier. Depending on the complexity of the system being developed, the task gets tougher. For example, different pieces of IP may be the output of various teams… Read More


Balancing Test Requirements with SOC Security

Balancing Test Requirements with SOC Security
by Tom Simon on 03-17-2022 at 6:00 am

Secure Test for SOCs

Typically, there is an existential rift between the on-chip access requirements for test and the need for security in SoCs. Using traditional deterministic scan techniques has meant opening up full read and write access to the flops in a design through the scan chains. Having this kind of access easily defeats the best designed… Read More


Siemens EDA on the Best Verification Strategy

Siemens EDA on the Best Verification Strategy
by Bernard Murphy on 03-16-2022 at 6:00 am

3 pillars min

Harry Foster opened and wrapped a tutorial at DVCon 2022 on “The Best Verification Strategy You’ve Never Heard Of”. Harry started with a common refrain on verification; we face a crisis thanks to a combination of growing complexity in the systems we are able to design, yet double exponential growth in verification cost for… Read More