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New ECO Product – Synopsys PrimeClosure

New ECO Product – Synopsys PrimeClosure
by Daniel Payne on 09-29-2022 at 10:00 am

ECO types min

New EDA product launches are always an exciting time, and I could hear the energy and optimism from the voice of Manoj Chacko at Synopsys in our Zoom call about Synopsys PrimeClosure. During the physical implementation phase for IC designs there’s a big challenge to reach timing closure, and with advanced nodes the number… Read More


UCIe Specification Streamlines Multi-Die System Design with Chiplets

UCIe Specification Streamlines Multi-Die System Design with Chiplets
by Dave Bursky on 09-26-2022 at 10:00 am

protocol stack 1

Over the last few years, the design of application-specific ICs as well as high-performance CPUs and other complex ICs has hit a proverbial wall. This wall is built from several issues: first, chip sizes have grown so large that they can fill the entire mask reticle and that could limit future growth. Second, the large chip size impacts… Read More


Synopsys Vision Processor Inside SiMa.ai Edge ML Platform

Synopsys Vision Processor Inside SiMa.ai Edge ML Platform
by Bernard Murphy on 09-15-2022 at 6:00 am

Dynamic range min

SiMa.ai just announced that they achieved first silicon success on their new MLSoC, for AI applications at the edge, using Synopsys’ design, verification, IP and design services solutions. Notably this design includes the Synopsys ARC® EV74 processor (among other IP) for vision processing. SiMa.ai claim their platform, now… Read More


WEBINAR: Scalable, On-Demand (by the Minute) Verification to Reach Coverage Closure

WEBINAR: Scalable, On-Demand (by the Minute) Verification to Reach Coverage Closure
by Synopsys on 09-13-2022 at 10:00 am

Synopsys Verification Cloud Solutions

Verification has long been the most time-consuming and often resource-intensive part of chip development. Building out the infrastructure to tackle verification can be a costly endeavor, however. Emerging and even well-established semiconductor companies must weigh the Cost-of-Results (COR) against Time-to-Results

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WEBINAR: Intel Achieving the Best Verifiable QoR using Formal Equivalence Verification for PPA-Centric Designs

WEBINAR: Intel Achieving the Best Verifiable QoR using Formal Equivalence Verification for PPA-Centric Designs
by Synopsys on 08-30-2022 at 10:00 am

Synopsys Fusion Compiler

Synopsys Fusion Compiler offers advanced optimizations to achieve the best PPA (power, performance, area) on today’s high-performance cores and interconnect designs. However, advanced transformation techniques available in synthesis such as retiming, multi-bit registers, advanced datapath optimizations, etc. are

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An EDA AI Master Class by Synopsys CEO Aart de Geus

An EDA AI Master Class by Synopsys CEO Aart de Geus
by Daniel Nenni on 08-19-2022 at 8:00 am

Aart de Geus White House

I consider Dr. Aart de Geus one of the founding fathers of EDA and one of the most interesting people in the semiconductor industry. So it is not a surprise that Aart was chosen to attend the CHIPs Act signing at the White House.

Here is his current corporate bio:

Since co-founding Synopsys in 1986, Dr. Aart de Geus has expanded Synopsys… Read More


WEBINAR: Design and Verify State-of-the-Art RFICs using Synopsys / Ansys Custom Design Flow

WEBINAR: Design and Verify State-of-the-Art RFICs using Synopsys / Ansys Custom Design Flow
by Synopsys on 08-11-2022 at 8:00 am

Synopsys Ansys RF Flow Webinar

The design and characterization of RF circuits is a complex process that requires an RF designer to overcome a variety of challenges. Not only do they face the complexities posed by advanced semiconductor processes and the need to meet the demanding requirements of modern wireless standards, designers must also account for electromagnetic… Read More


DSP IP for High Performance Sensor Fusion on an Embedded Budget

DSP IP for High Performance Sensor Fusion on an Embedded Budget
by Kalar Rajendiran on 08-04-2022 at 6:00 am

VPX Vector DSP Core Data Types

Whether we realize it or not, everyday applications we use depend on data gathered by sensors. We can bet that pretty much every application uses at least a couple of different types of sensors, if not more. That is because different types of sensors are better suited to collect data depending on the application, the environment … Read More


Intelligently Optimizing Constrained Random

Intelligently Optimizing Constrained Random
by Bernard Murphy on 07-12-2022 at 6:00 am

Potential coverage problems min

“Who guards the guardians?” This is a question from Roman times which occurred to me as relevant to this topic. We use constrained random to get better coverage in simulation. But what ensures that our constrained random testbenches are not wanting, maybe over constrained or deficient in other ways? If we are improving with a faulty… Read More


Using STA with Aging Analysis for Robust IC Designs

Using STA with Aging Analysis for Robust IC Designs
by Daniel Payne on 06-23-2022 at 10:00 am

Gate Level Aging min

Our laptops and desktop computers have billions of transistors in their application processor chips, yet I often don’t consider the reliability effects of aging that the transistors experience in the chips. At the recent Synopsys User Group (aka SNUG), there was a technical presentation on this topic from Srinivas Bodapati,… Read More