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While it’s interesting to hear a tool-vendor’s point of view on the capabilities of their product, it’s always more compelling to hear a customer/user point of view, especially when that customer is NVIDIA, a company known for making monster chips.
A quick recap on the concept. At 7nm, operating voltages are getting much closer… Read More
I was driving recently on highway 87 (San Jose) and wanted to merge left. I checked my side-mirror, checked the blind-spot detector, saw no problems and started to move over – and quickly swerved back when a car shot by on my left. What went wrong? My blind-spot detection, a primary feature in ADAS (advanced driver assistance systems,… Read More
Want to know how NVIDIA signs off on power integrity and reliability on mega-chips? Read on.
PPA over-design has repercussions in increased product cost and potential missed schedules with no guarantee of product success. Advanced SoCs pack more functionality and performance resulting in higher power density, but traditional… Read More
Power integrity and reliability are just as important for AMS designs as they are for digital designs. Ansys is offering a series of five webinars on this topic, under a heading they call ANSYS in ACTION, a bi-weekly demo series from ANSYS in which an application engineer shows you how simulation can address common applications.… Read More
Recently we have been swamped by news of Artificial Intelligence applications in hardware and software by the increased adoption of Machine Learning (ML) and the shift of electronic industry towards IoT and automobiles. While plenty of discussions have covered the progress of embedded intelligence in product roll-outs, an… Read More
Ansys recently hosted a webinar on reliability signoff for FinFET-based designs, spanning thermal, EM, ESD, EMC and aging effects. I doubt you’re going to easily find a more comprehensive coverage of reliability impact and analysis solutions. If you care about reliability in FinFET designs, you might want to check out this webinar.… Read More
ANSYS and TSMC will be co-presenting at ARM TechCon on Multiphysics Reliability Signoff for Next Generation Automotive Electronics Systems. The event is on Thursday October 26th, 10:30am-11:20am in Grand Ballroom B.
You can get a free Expo pass which will give you access to this event HERE and see the session page for the event … Read More
In automotive applications, advanced FinFET processes are great for high levels of integration and low power. But they also present some new challenges in reliability signoff. Ansys will be hosting a webinar to highlight the challenges faced by engineers trying to ensure thermal, electromigration (EM) and electrostatic discharge… Read More
The semiconductor industry has built decades of success on hyper-integration to increase functionality and performance while also reducing system cost. But the standard way to do this, to jam more and more functionality onto a single die, breaks down when some of the functions you want to integrate are built in different processes.… Read More
I’ve written before about how Ansys applies big data analytics and elastic compute in support of power integrity and other types of analysis. A good example of the need follows this reasoning: Advanced designs today require advanced semiconductor processes – 16nm and below. Designs at these processes run at low voltages, much… Read More