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Fast & Accurate Thermal Analysis of 3D-ICs

Fast & Accurate Thermal Analysis of 3D-ICs
by Pawan Fangaria on 04-14-2014 at 11:00 am

As Moore’s law started saturating on a single semiconductor die, the semiconductor community came up with the approach of growing vertically by stacking dies one above other in a 3D-IC arrangement. However, a major concern with a 3D-IC is that the heat generated by each die can get trapped in the stack, and hence it’s extremely important… Read More


Early RTL Power Analysis and Reduction

Early RTL Power Analysis and Reduction
by Daniel Payne on 03-26-2014 at 4:48 pm

Power analysis and reduction for SoC designs is a popular topic because of our consumer electronics dominated economy, and the need to operate devices on a battery source for the maximum time before a recharge. Just from my desk I can see multiple battery-powered devices: Laptop, tablet, smart phone, e-book reader, bluetooth … Read More


Xilinx & Apache Team up for FPGA Reliability at 20nm

Xilinx & Apache Team up for FPGA Reliability at 20nm
by Pawan Fangaria on 03-17-2014 at 12:00 am

In this age of SoCs with hundreds of IPs from different sources integrated together and working at high operating frequencies, FPGA designers are hard pressed keeping up the chip reliability from issues arising out of excessive static & dynamic IR drop, power & ground noise, electro migration and so on. While the IPs are… Read More


How to meet 3Ps in 3D-ICs with sub-20nm Dies?

How to meet 3Ps in 3D-ICs with sub-20nm Dies?
by Pawan Fangaria on 03-06-2014 at 1:30 am

It feels to be at the top of semiconductor technology by having dies with high density of semiconductor design at sub-20nm technology node stacked together into a 3D-IC to form a complete SoC which can accommodate billions of gates. However there are multiple factors to be looked at in order to make that successful amid often conflicting… Read More


Who Won the DesignVision Awards at DesignCon this year?

Who Won the DesignVision Awards at DesignCon this year?
by Daniel Payne on 02-07-2014 at 7:37 pm

The Seattle Seahawks had an awesome victory in the SuperBowl against the Denver Broncos, so folks living here in the Pacific Northwest are feeling proud and optimistic. The recent DesignConconference and exhibit ended 10 days ago and there were also victors announced in terms of the annual DesignVision awards that have three … Read More


Dual Advantage of Intelligent Power Integrity Analysis

Dual Advantage of Intelligent Power Integrity Analysis
by Pawan Fangaria on 02-03-2014 at 9:30 am

Often it is considered safer to be pessimistic in estimating IR-drop to maintain power integrity of semiconductor designs; however that leads to the use of extra buffering and routing resources which may not be necessary. In modern high speed, high density SoCs having multiple blocks, memories, analog IPs with different functionalities… Read More


Low Power @ DesignCon 2014

Low Power @ DesignCon 2014
by Daniel Nenni on 01-08-2014 at 11:00 am

Taking place annually in Silicon Valley, DesignCon is the premier educational conference and technology exhibition for electronic design engineers in the high speed communications and semiconductor communities.

Created by engineers for engineers, DesignCon is the largest gathering of chip, board and systems designersRead More


Mission Critical Role of Unmanned Systems – How to fulfill?

Mission Critical Role of Unmanned Systems – How to fulfill?
by Pawan Fangaria on 01-05-2014 at 11:30 am

Do we ever imagine what kind of severe challenges mission critical unmanned systems in air, land and underwater face? They are limited in space and size; have to be light in weight, flexible in different types of operations and at the same time rugged enough to work in extreme climatic conditions. That’s not enough; amidst these … Read More


How to Assure Quality of Power and SI Verification?

How to Assure Quality of Power and SI Verification?
by Pawan Fangaria on 12-08-2013 at 10:05 am

As power has become one of the most important criteria in semiconductor design today, I was wondering whether there is a standard set for the power verification for an overall chip. We do have formats evolved like CPF and UPF and there are tools available to check power and signal integrity (SI), however I don’t see a standard objective… Read More


Full Chip ESD Sign-off – Necessary

Full Chip ESD Sign-off – Necessary
by Pawan Fangaria on 11-13-2013 at 7:00 pm

As Moore’s law keeps going, semiconductor design density on a chip keeps increasing. The real concern today is that the shrinkage in technology node has rendered the small wire geometry and gate oxide thickness (although fine in all other perspectives) extremely vulnerable to ESD (Electrostatic Discharge) effects. More than… Read More