As Moore’s law started saturating on a single semiconductor die, the semiconductor community came up with the approach of growing vertically by stacking dies one above other in a 3D-IC arrangement. However, a major concern with a 3D-IC is that the heat generated by each die can get trapped in the stack, and hence it’s extremely important… Read More
Early RTL Power Analysis and Reduction
Power analysis and reduction for SoC designs is a popular topic because of our consumer electronics dominated economy, and the need to operate devices on a battery source for the maximum time before a recharge. Just from my desk I can see multiple battery-powered devices: Laptop, tablet, smart phone, e-book reader, bluetooth … Read More
Xilinx & Apache Team up for FPGA Reliability at 20nm
In this age of SoCs with hundreds of IPs from different sources integrated together and working at high operating frequencies, FPGA designers are hard pressed keeping up the chip reliability from issues arising out of excessive static & dynamic IR drop, power & ground noise, electro migration and so on. While the IPs are… Read More
How to meet 3Ps in 3D-ICs with sub-20nm Dies?
It feels to be at the top of semiconductor technology by having dies with high density of semiconductor design at sub-20nm technology node stacked together into a 3D-IC to form a complete SoC which can accommodate billions of gates. However there are multiple factors to be looked at in order to make that successful amid often conflicting… Read More
Who Won the DesignVision Awards at DesignCon this year?
The Seattle Seahawks had an awesome victory in the SuperBowl against the Denver Broncos, so folks living here in the Pacific Northwest are feeling proud and optimistic. The recent DesignConconference and exhibit ended 10 days ago and there were also victors announced in terms of the annual DesignVision awards that have three … Read More
Dual Advantage of Intelligent Power Integrity Analysis
Often it is considered safer to be pessimistic in estimating IR-drop to maintain power integrity of semiconductor designs; however that leads to the use of extra buffering and routing resources which may not be necessary. In modern high speed, high density SoCs having multiple blocks, memories, analog IPs with different functionalities… Read More
Low Power @ DesignCon 2014
Taking place annually in Silicon Valley, DesignCon is the premier educational conference and technology exhibition for electronic design engineers in the high speed communications and semiconductor communities.
Created by engineers for engineers, DesignCon is the largest gathering of chip, board and systems designers… Read More
Mission Critical Role of Unmanned Systems – How to fulfill?
Do we ever imagine what kind of severe challenges mission critical unmanned systems in air, land and underwater face? They are limited in space and size; have to be light in weight, flexible in different types of operations and at the same time rugged enough to work in extreme climatic conditions. That’s not enough; amidst these … Read More
How to Assure Quality of Power and SI Verification?
As power has become one of the most important criteria in semiconductor design today, I was wondering whether there is a standard set for the power verification for an overall chip. We do have formats evolved like CPF and UPF and there are tools available to check power and signal integrity (SI), however I don’t see a standard objective… Read More
Full Chip ESD Sign-off – Necessary
As Moore’s law keeps going, semiconductor design density on a chip keeps increasing. The real concern today is that the shrinkage in technology node has rendered the small wire geometry and gate oxide thickness (although fine in all other perspectives) extremely vulnerable to ESD (Electrostatic Discharge) effects. More than… Read More