WP_Term Object
(
    [term_id] => 34
    [name] => Ansys, Inc.
    [slug] => ansys-inc
    [term_group] => 0
    [term_taxonomy_id] => 34
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 263
    [filter] => raw
    [cat_ID] => 34
    [category_count] => 263
    [category_description] => 
    [cat_name] => Ansys, Inc.
    [category_nicename] => ansys-inc
    [category_parent] => 157
    [is_post] => 
)
            
3dic banner 800x100
WP_Term Object
(
    [term_id] => 34
    [name] => Ansys, Inc.
    [slug] => ansys-inc
    [term_group] => 0
    [term_taxonomy_id] => 34
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 263
    [filter] => raw
    [cat_ID] => 34
    [category_count] => 263
    [category_description] => 
    [cat_name] => Ansys, Inc.
    [category_nicename] => ansys-inc
    [category_parent] => 157
    [is_post] => 
)

FinFET Designs Need Early Reliability Analysis

FinFET Designs Need Early Reliability Analysis
by Pawan Fangaria on 02-19-2015 at 9:30 pm

In a world with mobile and IoT devices driven by ultra-low power, high performance and small footprint transistors, FinFET based designs are ideal. FinFETs provide high current drive, low leakage and high device density. However, a FinFET transistor is more exposed to thermal issues, electro migration (EM), and electrostatic… Read More


ANSYS Talks About Multi Physics for Thermal Analysis at DesignCon

ANSYS Talks About Multi Physics for Thermal Analysis at DesignCon
by Tom Simon on 01-27-2015 at 9:00 am

ANSYS makes a big deal of being a multi-physics company. Still it has taken them a while to fully integrate Apache. Nevertheless it seems like there is a compelling argument for combining technologies to solve SOC design problems. Frankly most chip designers would be hard pressed to think of a reason for using computational fluidRead More


Analyze Substrate Noise in SoC Design?

Analyze Substrate Noise in SoC Design?
by Pawan Fangaria on 01-19-2015 at 4:00 pm

Often substrate noise analysis takes place when everything is there on the chip, but that stage comes near the tape-out which is too late to make major changes in architecture, placement, introducing noise protection circuitry for the victims and so on. It was okay when there used to be very little analog content on the chip. But … Read More


ANSYS Updates RedHawk for FinFET Nodes

ANSYS Updates RedHawk for FinFET Nodes
by Tom Simon on 12-30-2014 at 7:00 am

Most designers are not using FinFETs yet, however the increased transistor density and power advantages they offer are compelling. Smaller feature sizes have been a consistent driver in semiconductor technology. Eventually the market will move more and more to FinFET processes, increasingly leaving behind planar transistors.… Read More


Solution for PI, TI & SI Issues in 3D-ICs

Solution for PI, TI & SI Issues in 3D-ICs
by Pawan Fangaria on 11-30-2014 at 7:00 pm

As we move towards packing more and more functionalities and increasing densities of SoCs, the power, thermal and signal integrity issues keep on rising. 3D-IC is a great concept to stack multiple dies on top of each other vertically. While it brings lot of avenues to package dies with multiple functions together, it has challenges… Read More


Noise & Reliability of FinFET Designs – Success Stories!

Noise & Reliability of FinFET Designs – Success Stories!
by Pawan Fangaria on 11-01-2014 at 7:00 am

I think by now there has been good level of discussion on FinFET technology at sub-20 nm process nodes and this is an answer to ultra dense, high performance, low power, and billion+ gate SoC designs within the same area. However, it comes with some of the key challenges with respect to power, noise and reliability of the design. A FinFET… Read More


ANSYS Electronics Simulation Expo – A View from Industry

ANSYS Electronics Simulation Expo – A View from Industry
by Pawan Fangaria on 10-24-2014 at 7:30 am

As we are seeing more and more automation in most of our activities, not only through software but also smart electronics (at cutting-edge technologies) equipped with processors, micro-controllers, sensors and so on which make a whole system as an integrated entity on a small piece of semiconductor intertwined with other systems… Read More


ANSYS Tools Shine at FinFET Nodes!

ANSYS Tools Shine at FinFET Nodes!
by Pawan Fangaria on 09-30-2014 at 4:00 pm

In the modern semiconductor ecosystem we are seeing rapid advancement in technology breaking past once perceived limits; 28nm, 20nm, 16-14nm, 10nm and we are foreseeing 7nm now. Double and multi-patterning are already being seen along with complex FinFET structures in transistors to gain the ultimate advantages in PPA from… Read More


A Comprehensive Power Analysis Solution for SoC+Package

A Comprehensive Power Analysis Solution for SoC+Package
by Pawan Fangaria on 09-08-2014 at 4:00 pm

Since power has become a critical factor in semiconductor chip design, the stress is towards decreasing supply voltage to reduce power consumption. However, the threshold voltage to switch devices cannot go down beyond a certain limit and these results in an extremely narrow margin for noise between the two. And that gets further… Read More


FinFET Design for Power, Noise and Reliability

FinFET Design for Power, Noise and Reliability
by Daniel Payne on 08-29-2014 at 4:00 pm

IC designers have been running analysis tools for power, noise and reliability for many years now, so what is new when you start using FinFET transistors instead of planar transistors? Calvin Chow from ANSYS (Apache Design) presented on this topic earlier in the summer through a 33 minutewebinar that has been archived. There is… Read More