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A Complete Simulation Platform for Mobile Systems

A Complete Simulation Platform for Mobile Systems
by Pawan Fangaria on 08-23-2015 at 7:00 am

If we take an insight into the semiconductor industry, we can easily find that mobile systems are the main drivers of this industry. The Smartphone business has remained at the top since a good number of years. Although the Smartphone sales growth has started showing a sign of stagnation, it is still a main contributor with a solid… Read More


How PowerArtist Interfaces with Emulators

How PowerArtist Interfaces with Emulators
by Pawan Fangaria on 07-16-2015 at 5:00 pm

Last month in DAC I could see some of the top innovations in the EDA world. EDA is a key enabler for advances in semiconductor designs. Among a number of innovations worth mentioning (about which I blogged just after DAC), the integration of Mentor’s Veloce with ANSYS’ PowerArtist for power analysis of live applications caught my… Read More


Benefits of RTL Power Budgeting

Benefits of RTL Power Budgeting
by Daniel Payne on 07-15-2015 at 4:00 am

Only one company at the recent DAC conference and exhibit had a set of four interacting disciplines: Fluids, Structures, Electronics and Systems. Did you guess that the company was ANSYS? I get so IC focused at times that I almost forget that chips plug into boards, that boards become systems, and that systems drive and control mechanical… Read More


Trends in Automotive Electronics at #52DAC

Trends in Automotive Electronics at #52DAC
by Daniel Payne on 07-05-2015 at 4:00 pm

The coolest and most expensive car at DAC this year had to be the McLaren P1, priced at $1,150,00 and powered by a 903 hp gas/electric hybrid. Electronics are used in autos to provide safety features, infotainment, motor control and performance.

Also at DAC this year there was an Automotive Village with more cars and experts from … Read More


A Key Partner in the Semiconductor Ecosystem

A Key Partner in the Semiconductor Ecosystem
by Pawan Fangaria on 05-19-2015 at 5:00 pm

Often we hear about isolated instances of excellence from various companies in the semiconductor industry which contribute significantly in building the overall ecosystem. While the individual excellence is essential, it’s rather more important how that excellence is utilized in a larger way by the industry to create a ‘value… Read More


Will your next SoC fail because of power noise integrity in IP blocks?

Will your next SoC fail because of power noise integrity in IP blocks?
by Daniel Payne on 04-14-2015 at 5:00 pm

By the time that your SoC comes back from the fab and you plugin it into a socket on a board for testing, it’s a little late in the cycle to start thinking about reliability concerns like: dynamic voltage drop, noise coupling, EM (Electro-Migration), self-heating, thermal analysis and ESD (Electro-Static Discharge). They… Read More


ANSYS Enters the League of 10nm Designs with TSMC

ANSYS Enters the League of 10nm Designs with TSMC
by Pawan Fangaria on 04-09-2015 at 7:00 pm

The way we are seeing technology progression these days is unprecedented. It’s just about six months ago, I had written about the intense collaboration between ANSYSand TSMCon the 16nm FinFET based design flow and TSMC certifying ANSYS tools for TSMC 16nm FF+ technology and also conferring ANSYS with “Partner of the Year” award.… Read More


ANSYS Event to Highlight Cutting Edge Technology Development

ANSYS Event to Highlight Cutting Edge Technology Development
by Tom Simon on 04-02-2015 at 5:00 pm

If you follow technology news, it would be hard to deny that we live in exciting times. In some ways there is an unparalleled amount of big and cool technology development going on right now. We all have followed the rise of Tesla Motors. They took over a long vacant US big-auto plant in Fremont and are reinventing the US automobile industry.… Read More


SoCs More Vulnerable to ESD at Lower Nodes

SoCs More Vulnerable to ESD at Lower Nodes
by Pawan Fangaria on 03-11-2015 at 1:00 pm

Electro Static Discharge (ESD) has been a major cause of failures in electronic devices. As the electronic devices have moved towards high density SoCs accommodating ever increasing number of gates at lower process nodes, their vulnerability to ESD effects has only increased. Among the reasons for ESD failures in SoCs, device… Read More


On-Chip Power Integrity Analysis Moves to the Package

On-Chip Power Integrity Analysis Moves to the Package
by Tom Simon on 03-11-2015 at 1:00 am

Power regimes for contemporary SOC’s now include a large number of voltage domains. Rail voltages are matched closely to the performance and power requirements of various portions of the design. Indeed, some of the supply voltages are so low that the noise margins in these domains is exceedingly low. Higher voltage domains are… Read More