I’ve blogged about the Calibre family of IC design tools before:
Smart Fill replaced Dummy Fill Approach in a DFM Flow
DRC Wiki
Graphical DRC vs Text-based DRC
Getting Real time Calibre DRC Results with Custom IC Editing
Transistor-level Electrical Rule Checking
Who Needs a 3D Field Solver for IC Design?
Prevention is Better… Read More
The webinar on CPS (chip-package-system) is on Tuesday 9th August at 11am Pacific time. It will be conducted by Christopher Ortiz, Principal Application Engineer at Apache Design Solutions. Dr. Ortiz has been with Apache since 2007, supporting the Sentinel product line. Prior to Apache he worked at Agere / LSI, where he investigated… Read More
The Totem webinar will be at 11am on Tuesday 2nd August. This session will be conducted by Karan Sahni, Senior Applications Engineer at Apache Design Solutions. Karan has been with Apache since 2008, supporting the Redhawk, Totem, Sentinel product lines. He received his MS in Electrical Engineering from the Syracuse University… Read More
Hard to believe EDA360, the Cadence Blueprint toBattle ‘Profitability Gap’; Counters Semiconductor Industry’s Greatest Threat!, is DEAD at the ripe old age of one. As you may have already read John Bruggeman left Cadence after the company conference call last week. The formal announcement should go out on Monday after the SEC… Read More
Competition is what made the semiconductor industry and semiconductors themselves what they are today! Competition is what drives innovation and keeps costs down. Not destructive competition, where the success of one depends on the failure of another, but constructive competition that promotes mutual survival and growth… Read More
Sorry to disappoint but my 2 hours at the Intel RNB was a very positive experience. It is much more fun writing negative things about industry leaders because I enjoy the resulting hate mail and personal attacks, but the candor and transparency of the Intel guys won me over. They even asked ME questions which was a bit telling. I also… Read More
Design for test (DFT) imposes various restrictions on the design so that the test automation tools (automatic test pattern approaches such as scan, as well as built-in self-test approaches) will subsequently be able to generate the test program. For example, different test approaches impose constraints on clock generation… Read More
Intel’s new Tri-Gate technology is causing quite a stir on the stock chat groups. Some have even said if Intel uses its Tri-Gate technology on only Intel processors ARM will be in deep deep trouble. These guys are “Intel Longs” of course and they are battling “Intel Shorts” with cut and paste news clips.
“ARM is in trouble & this… Read More
At DAC 2011 in San Diego, Apache gave many product presentations. Of course not everyone could make DAC or could make all the presentations in which they were interested. So from mid-July until mid-August these presentations will be given as webinars. Details, and links for registration, are here on the Apache website.
The seminars… Read More
Introduction
Before DAC I met with Stephen Pateras, Ph.D. at Mentor Graphics, he is the Product Marketing Director in the Silicon Test Solutions group. Stephen has been at Mentor for two years and was part of the LogicVision acquisition. He was in early at LogicVision and went through their IPO, before that he was at IBM in the mainframe… Read More
