SEMulator3D 2014 – New Enhancements for Virtual Fabrication in the 3D IC Era

SEMulator3D 2014 – New Enhancements for Virtual Fabrication in the 3D IC Era
by Pawan Fangaria on 04-05-2014 at 7:30 am

A Virtual Platform for any kind of design or manufacturing in any discipline of science or engineering (electrical, mechanical, aeronautics etc.) must be able to provide an accurate representation of an actual design/product in a fraction of time and cost it takes to build working prototypes. In the case of semiconductors at … Read More


FinFET Custom Design

FinFET Custom Design
by Paul McLellan on 04-02-2014 at 8:30 pm

At CDNLive, Bob Mullen of TSMC gave a presentation on their new custom FinFET flow, doing design, and verifying designs. At 16nm there are all sorts of relatively new verification problems such as layout dependent effects (LDE) and voltage dependent design rules. We had some of this at 20nm but like most things in semiconductor,… Read More


IP Challenges, FinFET, 3D-IC, and FD-SOI Updates

IP Challenges, FinFET, 3D-IC, and FD-SOI Updates
by Daniel Nenni on 03-27-2014 at 10:00 am

Semiwiki is proud to be a sponsor of EDPS 2014:

April 17 & 18, 2014
Monterey Beach Hotel, Monterey, CA

Sponsored by:
IEEE Computer Society of Silicon Valley (CS-SCV)
IEEE Computer Society
Design Automation Technical Committee (DATC)
Council on Electronic Design Automation (CEDA)

The Electronic Design Processes Symposium… Read More


Handel Jones on FD-SOI vs FinFET

Handel Jones on FD-SOI vs FinFET
by Paul McLellan on 03-20-2014 at 1:27 am

Handel Jones has a new white-paper out titled Why Migration to FD-SOI is a Better Approach Than Bulk CMOS and FinFETs at 20nm and 14/16nm for Price-Sensitive Markets. Handel has done an in-depth analysis of the wafer and die costs of the various approaches, bulk planar (what we have been doing up to now), FD-SOI and FinFET. The analysis… Read More


ISSCC: Analog-Digital Converter in FD-SOI

ISSCC: Analog-Digital Converter in FD-SOI
by Paul McLellan on 02-20-2014 at 11:50 am

The International Solid-State Circuits Conference (ISSCC) was last week in San Francisco. Stéphane Le Tual, Pratap Narayan Singh, Christophe Curis, Pierre Dautriche, all from STMicroelectronics presented a paper on A 20GHz-BW 6b 10GS/s 32mW Time-Interleaved SAR ADC with Master T&H in 28nm UTBB FDSOI TechnologyRead More


Designing an SoC with 16nm FinFET

Designing an SoC with 16nm FinFET
by Daniel Payne on 02-11-2014 at 9:35 pm

IC designers contemplating the transition to 16nm FinFET technology for their next SoC need to be informed about design flow and IP changes, so TSMC teamed up with Cadence Design Systems today to present a webinar on that topic. I attended the webinar and will summarize my findings.

Shown below is a 3D layout concept of an ideal FinFET… Read More


SOI Future or Flop?

SOI Future or Flop?
by Scotten Jones on 01-31-2014 at 8:00 am

Silicon On Insulator (SOI) is a technology that has been in use by the semiconductor industry for a long time. Early technologies such as Silicon On Sapphire (SOS) were reported as early as the sixties. In the eighties technologies such as V groove dielectric isolation were used. In the nineties we saw wafer bonding become the most… Read More


Why SOI is the Future Technology of Semiconductor

Why SOI is the Future Technology of Semiconductor
by Eric Esteve on 01-14-2014 at 8:34 am

No doubt that FDSOI generate high interest these days and I found a very interesting contribution from Zvi Or-Bach, President and CEO of MonolithIC 3D, Inc. Zvi has accepted to share his wrap-up from IEDM, in a blog for Semiwiki readers. If you remember the long discussion we had in Semiwiki about cost comparison, some comments were… Read More


Patterns looking inside, not just between, logic cells

Patterns looking inside, not just between, logic cells
by Don Dingee on 12-27-2013 at 5:00 pm

Traditional logic testing relies on blasting pattern after pattern at the inputs, trying to exercise combinations to shake faults out of logic and hopefully have them manifested at an observable pin, be it a test point or a final output stage. It’s a remarkably inefficient process with a lot of randomness and luck involved.

Getting… Read More


Semicon Technology Advancement – A View From IEDM

Semicon Technology Advancement – A View From IEDM
by Pawan Fangaria on 12-20-2013 at 10:00 am

As I see the semiconductor industry going through significant changes and advances, yet ironically plagued by a growing perception that the pace of scaling is slowing, I was inclined to take a peek into what the industry experts say about the state of the industry and the future of Moore’s Law. Fortunately, at last week’s InternationalRead More