Designing an SoC with 16nm FinFET

Designing an SoC with 16nm FinFET
by Daniel Payne on 02-11-2014 at 9:35 pm

IC designers contemplating the transition to 16nm FinFET technology for their next SoC need to be informed about design flow and IP changes, so TSMC teamed up with Cadence Design Systems today to present a webinar on that topic. I attended the webinar and will summarize my findings.

Shown below is a 3D layout concept of an ideal FinFET… Read More


SOI Future or Flop?

SOI Future or Flop?
by Scotten Jones on 01-31-2014 at 8:00 am

Silicon On Insulator (SOI) is a technology that has been in use by the semiconductor industry for a long time. Early technologies such as Silicon On Sapphire (SOS) were reported as early as the sixties. In the eighties technologies such as V groove dielectric isolation were used. In the nineties we saw wafer bonding become the most… Read More


Why SOI is the Future Technology of Semiconductor

Why SOI is the Future Technology of Semiconductor
by Eric Esteve on 01-14-2014 at 8:34 am

No doubt that FDSOI generate high interest these days and I found a very interesting contribution from Zvi Or-Bach, President and CEO of MonolithIC 3D, Inc. Zvi has accepted to share his wrap-up from IEDM, in a blog for Semiwiki readers. If you remember the long discussion we had in Semiwiki about cost comparison, some comments were… Read More


Patterns looking inside, not just between, logic cells

Patterns looking inside, not just between, logic cells
by Don Dingee on 12-27-2013 at 5:00 pm

Traditional logic testing relies on blasting pattern after pattern at the inputs, trying to exercise combinations to shake faults out of logic and hopefully have them manifested at an observable pin, be it a test point or a final output stage. It’s a remarkably inefficient process with a lot of randomness and luck involved.

Getting… Read More


Semicon Technology Advancement – A View From IEDM

Semicon Technology Advancement – A View From IEDM
by Pawan Fangaria on 12-20-2013 at 10:00 am

As I see the semiconductor industry going through significant changes and advances, yet ironically plagued by a growing perception that the pace of scaling is slowing, I was inclined to take a peek into what the industry experts say about the state of the industry and the future of Moore’s Law. Fortunately, at last week’s InternationalRead More


Could FD-SOI be Cheaper too?

Could FD-SOI be Cheaper too?
by Eric Esteve on 12-08-2013 at 11:00 am

We agree now that FD-SOI technology is Faster, Cooler, Simpler. But can it also be a cheaper technology? Let start with an overview of the current estimation of the development cost for complex SoC on advanced technology nodes. The following data are extracted from International Business Strategies, Inc 2013 report. The first… Read More


ASICs for Bitcoin Mining!

ASICs for Bitcoin Mining!
by Daniel Nenni on 11-12-2013 at 8:00 pm

One of the hottest areas for Application Specific Integrated Circuits today is Bitcoin mining. A good friend of mine has a son who is involved in a Bitcoin start-up so we have been discussing this at great length and I will share what I have learned thus far. Coincidently, my wife asked me about Bitcoin during our most recent walk down… Read More


ARM in Samsung 14nm FinFET

ARM in Samsung 14nm FinFET
by Paul McLellan on 10-30-2013 at 4:28 pm

I am at ARM TechCon today. One interesting presentation was made jointly between Samsung, Cadence and ARM themselves about developing physical libraries (ARM), a tool flow (Cadence) and test chips (Samsung). It was titled Samsung ARM and Cadence collaborate on the silicon-proven world first 14-nm FinFET Cortex-A7 ARM CPU and… Read More


The Alternative to FinFET: FD-SOI

The Alternative to FinFET: FD-SOI
by Paul McLellan on 10-30-2013 at 11:00 am

Everywhere you turn these days you find FinFETs. Intel has had them since 22nm (they use the word Tri-gate but it is the same as what the world calls FinFET) and TSMC will have them at 16nm. So why FinFET? And is there an alternative?

The reason that regular bulk planar transistors have run out of steam is that the channel area underneath… Read More


Mentor Seminar: Evolution of diagnosis-driven yield analysis

Mentor Seminar: Evolution of diagnosis-driven yield analysis
by Beth Martin on 10-08-2013 at 1:20 pm

It’s a fact that new process nodes come with some amount of yield challenges. One way to find and eliminate silicon defects is through diagnosis-driven yield analysis (DDYA), which is the topic of a free seminar by Mentor Graphics in Fremont this Thursday, October 10 from 11:30am – 2pm (yes, lunch is included because Mentor… Read More