WP_Term Object
(
    [term_id] => 57
    [name] => MunEDA
    [slug] => muneda
    [term_group] => 0
    [term_taxonomy_id] => 57
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 43
    [filter] => raw
    [cat_ID] => 57
    [category_count] => 43
    [category_description] => 
    [cat_name] => MunEDA
    [category_nicename] => muneda
    [category_parent] => 157
    [is_post] => 
)
            
Pic800x100 1
WP_Term Object
(
    [term_id] => 57
    [name] => MunEDA
    [slug] => muneda
    [term_group] => 0
    [term_taxonomy_id] => 57
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 43
    [filter] => raw
    [cat_ID] => 57
    [category_count] => 43
    [category_description] => 
    [cat_name] => MunEDA
    [category_nicename] => muneda
    [category_parent] => 157
    [is_post] => 
)

WEBINAR: Using Design Porting as a Method to Access Foundry Capacity

WEBINAR: Using Design Porting as a Method to Access Foundry Capacity
by Tom Simon on 11-24-2021 at 8:00 am

Schematic Porting the NanoBeacon

There have always been good reasons to port designs to new foundries or processes. These reasons have included reusing IP in new projects, moving an entire design to a smaller node to improve PPA, or second sourcing manufacturing. While there can be many potential business motivations for any of the above, in today’s environment… Read More


Numerical Sizing and Tuning Shortens Analog Design Cycles

Numerical Sizing and Tuning Shortens Analog Design Cycles
by Tom Simon on 11-22-2021 at 6:00 am

Sizing and tuning

By any measure analog circuit design is a difficult and complex process. This point is driven home in a recent webinar by MunEDA. Michael Pronath, VP Products and Solutions at MunEDA, lays out why, even with the assistance of simulators, analog circuit sizing and tuning can consume weeks of time in what can potentially be a non-convergent… Read More


CEO Interview: Harald Neubauer of MunEDA

CEO Interview: Harald Neubauer of MunEDA
by Daniel Nenni on 07-09-2021 at 6:00 am

Harald Neubauer CEO of MunEDA

It has been my pleasure to interview Harald Neubauer, CEO of MunEDA. A veteran of the EDA industry, Harald cofounded MunEDA in 2001.

What brought you to the EDA industry?

Well, I always wanted to found a tech startup and was developing and evaluating various business ideas together with my later cofounder Andreas. Soon after we got… Read More


Webinar on Methods for Monte Carlo and High Sigma Analysis

Webinar on Methods for Monte Carlo and High Sigma Analysis
by Tom Simon on 06-12-2020 at 6:00 am

Advanced Monte Carlo Methods

There is an old saying popularized by Mark Twain that goes “There are three kinds of lies: lies, damned lies, and statistics.” It turns out that no one can say who originated this saying, yet despite however you might feel about statistics, they play an important role in verifying analog designs. The truth is that there are large numbers… Read More


Webinar on Tools and Solutions for Analog IP Migration

Webinar on Tools and Solutions for Analog IP Migration
by Tom Simon on 03-17-2020 at 10:00 am

MunEDA flow for analog design porting

The commonly advanced reason for IP reuse is lower cost and shorter development time. However, IP reuse presents its own challenges, especially for analog designs. In the case of digital designs, once a new standard cell library is available, it is usually not too hard to resynthesize RTL to create new working silicon. For analog… Read More


56th DAC – In Depth Look at Analog IP Migration from MunEDA

56th DAC – In Depth Look at Analog IP Migration from MunEDA
by Tom Simon on 07-31-2019 at 10:00 am

Every year at DAC, in addition to the hubbub of the exhibit floor and the relatively short technical sessions, there are a number of tutorials that dive in depth into interesting topics. At the 56th DAC in Las Vegas this year, MunEDA offered an interesting tutorial on Analog IP migration and optimization. This is a key issue for large… Read More


Free Webinar: Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis

Free Webinar: Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis
by Tom Simon on 04-29-2019 at 4:00 pm

The letters “PVT” roll of the tongue easily enough, belying the complexity that variations in process, temperature and voltage can cause for analog designs. For semiconductor processes, there are dozens of parameters that can affect the viability of a design. It would be easy enough to optimize a circuit with only one or two varying… Read More


Schematic porting – the key to analog design reuse

Schematic porting – the key to analog design reuse
by Tom Simon on 04-02-2018 at 12:00 pm

At the beginning of every project the one of the first questions that ought to be asked is whether there blocks from previous designs that can be reused. On the surface this seems pretty obvious. The wrinkle in this is that reusability varies a lot based on the design type and the effort that a team is willing to expend to bring a design… Read More


Using Sequential Testing to Shorten Monte Carlo Simulations

Using Sequential Testing to Shorten Monte Carlo Simulations
by Tom Simon on 12-27-2017 at 7:00 am

When working on an analog design, after initial design specs have been met, it is useful to determine if the design meets specs out to 3 or 4 sigma based on process variation. This can serve as a useful step before going any further. It might not be a coincidence that foundries base their Cpk on 3-sigma. To refresh, Cpk is the ratio of the… Read More


Seeking Solution for Saving Schematics?

Seeking Solution for Saving Schematics?
by Tom Simon on 11-24-2017 at 7:00 am

Schematics are still the lynchpin of analog design. In the time that HDL’s have revolutionized digital design, schematics have remained drawn and used much as they have been for decades. While the abstraction of HDL based designs has made process and foundry porting relatively straightforward, porting schematic based designs… Read More