WP_Term Object
(
    [term_id] => 43
    [name] => Magwel
    [slug] => magwel
    [term_group] => 0
    [term_taxonomy_id] => 43
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 28
    [filter] => raw
    [cat_ID] => 43
    [category_count] => 28
    [category_description] => 
    [cat_name] => Magwel
    [category_nicename] => magwel
    [category_parent] => 157
)
            
WP_Term Object
(
    [term_id] => 43
    [name] => Magwel
    [slug] => magwel
    [term_group] => 0
    [term_taxonomy_id] => 43
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 28
    [filter] => raw
    [cat_ID] => 43
    [category_count] => 28
    [category_description] => 
    [cat_name] => Magwel
    [category_nicename] => magwel
    [category_parent] => 157
)
Magwel
Posted on by Daniel Nenni

Webinar of Recent NCTU CDM/ESD Keynote Talk by Dundar Dumlugol – Thursday September 26th

Webinar of Recent NCTU CDM/ESD Keynote Talk by Dundar Dumlugol – Thursday September 26th
by Daniel Nenni on 09-24-2019 at 10:00 am
Categories: EDA, Magwel

With many design teams still searching for an effective means of identifying Charged Device Model (CDM) issues early in the design process, it comes as no surprise that events on this topic generate a lot of interest and are well attended. In July Magwel’s CEO Dr. Dundar Dumlugol had the honor of being invited by Professor Ming-Dou Ker to speak at Taiwan’s National Chiao-Tung University (NCTU) on the topic of ESD and CDM event simulation. NCTU’s esteemed electrical engineering department serves as a center of expertise on the topic of ESD.

The session was well attended (myself included) and provided an excellent overview of the larger scope of ESD in general and on CDM specifically. Dundar reviewed the existing methods of analyzing an IC design for weaknesses that could lead to CDM related failures. He also discussed Magwel’s approach to solving these challenging design problems. During the talk he showed several examples of CDM discharge scenarios and what tools should be looking for in order to properly simulate the events.

The July seminar was recorded and is replayed HERE. This is a good opportunity to learn about the most effective ways to prevent CDM failures in finished designs. Magwel has applied their expertise in solver-based extractors and dynamic simulation to develop their CDMi tool. CDMi simulates current flows during high speed CDM pulses and determines which ESD devices are triggered. Overvoltage or overcurrent violations are reported through an intuitive UI.

About Us
Magwel® offers 3D field solver and simulation based analysis and design solutions for digital, analog/mixed-signal, power management, automotive, and RF semiconductors. Magwel® software products address power device design with Rdson extraction and electro-migration analysis, ESD protection network simulation/analysis, latch-up analysis and power distribution network integrity with EMIR and thermal analysis. Leading semiconductor vendors use Magwel’s tools to improve productivity, avoid redesign, respins and field failures. Magwel is privately held and is headquartered in Leuven, Belgium. Further information on Magwel can be found at www.magwel.com

Share this post via:

Comments

There are no comments yet.

You must register or log in to view/post comments.