Redefining ESD signoff (once again) with Pathfinder-SC

Redefining ESD signoff (once again) with Pathfinder-SC
by Admin on 08-31-2021 at 12:00 am

Time:
August 31, 2021
11:30 AM EDT / 4:30 PM BST / 9 PM IST

Venue:
Online

About this Webinar

As semiconductors move into the wafer-scale chip and chiplet era, there is increased focus on the power thermal and reliability area. One of the key aspects of reliability is ESD. While this phenomenon is understood at a higher-level, comprehending… Read More


Magwel Adds Core Device Checking for ESD Verification

Magwel Adds Core Device Checking for ESD Verification
by Tom Simon on 05-11-2021 at 10:00 am

ESDi-XL Core checking

In the past ESD sign-off has been accomplished by a combination of techniques. Often ESD experts are asked to look at a design and assess its ESD robustness based on experience gained from prior chips. Alternatively, designers are told to work with a set of rules given to them, again based on previous experience about what usually… Read More


Webinar Replay – Designing and Verifying HBM ESD Protection Networks

Webinar Replay – Designing and Verifying HBM ESD Protection Networks
by Tom Simon on 08-03-2020 at 10:00 am

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Every chip needs ESD protection, especially RF, analog and nm designs. Because each type of design has specific needs relating to IOs, pad rings, operating voltage, process, etc. it is important that the ESD protection network is carefully tailored to the design. Also because of interactions between the design and its ESD protection… Read More


WEBINAR: ESD Protection Network Verification Using Magwel’s ESDi for HBM Simulation

WEBINAR: ESD Protection Network Verification Using Magwel’s ESDi for HBM Simulation
by Daniel Nenni on 06-09-2020 at 10:00 am

Verifying the Electrostatic Discharge (ESD) protection network on an IC can be challenging, and if it is not done correctly it can lead to failures on the tester, reduced product reliability or shortened field life. In this webinar you will learn how Magwel’s ESDi thoroughly analyzes all pad combinations in a design for comprehensive… Read More


Free Webinar on Verifying On-Chip ESD Protection

Free Webinar on Verifying On-Chip ESD Protection
by Tom Simon on 06-03-2020 at 6:00 am

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Walking across a carpet can generate up to 35,000 volts of static charge, which is tens of thousands of times higher than the operating voltages of most integrated circuits. When charge build up from static electricity is exposed to the pins of an IC, the electrostatic discharge (ESD) protection network on the chip is intended to… Read More


Webinar of Recent NCTU CDM/ESD Keynote Talk by Dundar Dumlugol – Thursday September 26th

Webinar of Recent NCTU CDM/ESD Keynote Talk by Dundar Dumlugol – Thursday September 26th
by Daniel Nenni on 09-24-2019 at 10:00 am

With many design teams still searching for an effective means of identifying Charged Device Model (CDM) issues early in the design process, it comes as no surprise that events on this topic generate a lot of interest and are well attended. In July Magwel’s CEO Dr. Dundar Dumlugol had the honor of being invited by Professor Ming-Dou… Read More


SemiWiki WEBINAR: Avoiding Charged Device Model ESD Failure

SemiWiki WEBINAR: Avoiding Charged Device Model ESD Failure
by Daniel Nenni on 08-14-2019 at 10:00 am

Failures during manufacturing and assembly or in the field caused by charged device model (CDM) type ESD events are a serious concern for IC design teams. CDM failures are generally caused by charge build-up on device packages, which capacitively charge large internet nets, such as GND or VSS. Once a device pin contacts a current… Read More


Adding CDM Protection to a Real World LNA Test Case

Adding CDM Protection to a Real World LNA Test Case
by Tom Simon on 08-06-2019 at 6:00 am

In RF designs Low Noise Amplifiers (LNA) play a critical role in system operation. They simultaneously need to be extremely sensitive and noise free, yet also must be able to withstand strong signal input without distortion. LNA designers often struggle to meet device performance specifications. Their task is further complicated… Read More


The Flash and the Taiwan ESD Seminar!

The Flash and the Taiwan ESD Seminar!
by Daniel Nenni on 07-24-2019 at 6:00 am

During my trip through Asia last week I attended the Taiwan ESD Workshop. Hsinchu is densely populated with some of the smartest semiconductor people in the world so it is well worth the trip, absolutely.  As it turns out ESD is one of the top concerns in semiconductor design and manufacture. The current rule based and simulation … Read More


A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation

A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation
by Tom Simon on 06-03-2019 at 8:00 am

Lurking inside of every Mosfet is a parasitic bipolar junction transistor (BJT). Of course, in normal circuit operation the BJT does not play a role in the device operation. Accordingly, SPICE models for Mosfets do not behave well when the BJT is triggered. However, these models work just fine for most purposes. The one important… Read More