Large numbers of sensors, massive amounts of data, ever-increasing computing power, real-time operation and security concerns required for autonomous vehicles are driving the core of computation from the cloud to the edge of the network. Autonomous vehicles are constantly sensing and sending data on road conditions, location… Read More
UX in Agentic Systems. Innovation in VerificationA switch this month to principles behind building…Read More
The Shift to System-Level AI Drives Next-Generation SiliconAt its 2026 Technology Symposium, TSMC delivered a…Read More
All in One Bluetooth Audio: A Complete Solution on a TSMC 12nm Single DieThe rapid evolution of wireless audio has placed…Read More
Closing the Reality Gap: A New Architecture for 1.8-Tb/s Chiplet GovernanceBy Dr. Moh Kolbehdari Dr. Moh Kolbehdari is…Read More
SemiWiki Q&A with Julie Rogers, Executive Director, ESD AllianceThe Electronic System Design Alliance (ESD Alliance), a SEMI…Read MoreMusk’s Massive Mobile Gambit
A few weeks ago Mobile World Congress included among its keynotes a live interview with Tesla CEO Elon Musk moderated by Mobile World Live Publisher Justin Springham. The subject was Starlink, the low earth orbit (LEO) constellation intended to deliver global Internet access.
Mobile World Congress Musk keynote interview
Tongue-in-cheek… Read More
Debugging Embedded Software on Veloce
Arm provides great support for debugging embedded software in its CoreSight tools, but what support do you have if you’re debugging hardware and software together in a pre-implementation design? In a hardware debugger you have lots of support for hardware views like waveforms and register states. But these aren’t well connected… Read More
The Quest for Bugs: “Shift-Left, Right?”
Shift-left, why?
Shift-left testing is an approach to software and system testing which is performed earlier in the lifecycle (that is, moved left on the project timeline). It is the first half of the “Test early and often” maxim that was coined by Larry Smith in 2001.
It’s now an established idea, much talked about … Read More
On-the-Fly Code Checking Catches Bugs Earlier
There’s no question that chip designs are getting more complex, driven by the power, performance, and area (PPA) demands of applications like artificial intelligence (AI), automotive, and cloud computing. This complexity, of course, trickles down to the design and testbench code. When engineers can find and fix bugs before… Read More
Executable Specifications Shorten Embedded System Development
Even though AI is being used to replace procedural coding for many embedded applications, there is still, and will be for a long time, code that is written manually to deal with complicated inputs to control connected systems. Even in AI based systems there are programmer coded steps for responses to AI identified inputs. All of … Read More
Quantum Computing and Threats to Secure Communication
There is never a dearth of new terms, discoveries and inventions in the technological world. And sometimes existing terms get reinvigorated. And debates ensue. The debaters argue about the plusses and minuses and make some predictions. Such is the case with “Quantum Computing.” I recently watched and listened to a webinar that… Read More
Podcast EP32: Improving the Security of Hardware Designs
Dan is joined by Dr. Alric Altoff, senior hardware security engineer at Tortuga Logic. The security risks associated with speculative execution are discussed along with scalable methods to address these risks.
Dr. Alric Altoff has over 15 years of experience in hardware security, hardware/software co-design, and applied … Read More
Extreme Optics Innovation with Ansys SPEOS, Powered by NVIDIA GPUs
Optical engineers rely on Ansys SPEOS to deliver extreme product innovation — and NVIDIA dramatically accelerates the development cycle
Product autonomy, artificial intelligence, the Internet of Things (IoT) and other challenging trends are placing new demands on optical engineers in the automotive, aerospace and general… Read More
Stochastic Effects from Photon Distribution Entropy in High-k1 EUV Lithography
Recent advances in EUV lithography have largely focused on “low-k1” imaging, i.e., features with pitches less than the wavelength divided by the numerical aperture (k1<0.5). With a nominal wavelength of 13.5 nm and a numerical aperture of 0.33, this means sub-40 nm pitches. It is naturally expected that larger… Read More


Solving the EDA tool fragmentation crisis