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IEEE VLSI Test Symposium 2022
April 25, 2022 - April 27, 2022
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in the test, validation, yield, reliability, and security of microelectronic circuits and systems.
Due to the COVID-19 worldwide situation, the 2022 edition of VTS will be a fully virtual interactive live event.
Update: We offer an option for attendees to attend the first day of the symposium (April 25) in-person at Synopsys site in Northern California (details to come soon)
The symposium will take place on April 25-27, 2022.
The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions.
News for authors: VTS review process is DOUBLE BLIND with REBUTTAL, for both scientific papers and industrial application short papers. The references do not count towards the page limit.
You are invited to participate and submit your contributions to VTS’22. The areas of interest include (but are not limited to) the following topics:
VTS Topics
- Analog, Mixed-Signal, RF Test
- ATPG & Compression
- Silicon Debug
- Automotive Test & Safety
- Built-In Self-Test (BIST)
- Defect & Current Based Test
- Defect & Fault Tolerance
- Delay & Performance Test
- Design for Testability, Yield or Reliability
- Pre-silicon Design Verification & Validation
- Post-silicon Validation
- Embedded System & Board Test
- Embedded Test Methods
- Emerging Technologies Test and Reliability
- FPGA Test
- Fault Modeling and Simulation
- Hardware Security
- Low-Power IC Test
- Machine Learning in Test,Yield and Reliability
- Microsystems/MEMS/Sensors Test
- Memory Test and Repair
- On-Line Test & Error Correction
- Power & Thermal Issues in Test
- System-on-Chip (SOC) Test
- Test & Reliability of Biomedical Devices
- Test & Reliability of High-Speed I/O
- Test & Reliability of Machine Learning Systems
- Test Quality & Reliability
- Test Standards & Economics
- Test Resource Partitioning
- Transient & Soft Errors
- 2.5D, 3D & SiP Test
- Yield Optimization
New Hot Topics
VTS puts particular emphasis on enlarging its scope soliciting submissions on aspects on the following hot topics:
- Test, Reliability, and Security of Heterogeneous Devices Including Biomedical, Neuromorphic, and MEMS
- Test & Reliability of Machine Learning Systems
- Test, Reliability & Security in Quantum Computing
- Design and Test Methods for Yield Improvement
- Machine Learning for Test, Debug, and Yield Improvement
- Reliable in-Field Calibration of mm-Wave Devices
Real men have fabs!