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What’s New with Semiconductor Test and Failure Analysis at Mentor?

What’s New with Semiconductor Test and Failure Analysis at Mentor?
by Daniel Payne on 10-28-2011 at 6:03 pm

ISTFA
Silicon Valley is a great location for trade shows and technical conferences, so if you have an interest in test and failure analysis then don’t miss out on the 37th annual International Symposium for Testing and Failure Analysis. This year ISTFA will be held from Sunday, November 13th thru Thursday, November 17th … Read More


Think differentiation

Think differentiation
by Paul McLellan on 10-27-2011 at 5:01 pm

Wally Rhines’s keynote at the ARM TechCon was about differentiation and how to use it to create measurable value. We all know what differentiation means in some intuitive sense, but how do you make it measurable? Wally’s answer was that differentiation is a measure of the difficulty of switching suppliers and is best… Read More


AMS Design using Dongbu HiTek foundry and Tanner EDA Tools

AMS Design using Dongbu HiTek foundry and Tanner EDA Tools
by Daniel Payne on 10-27-2011 at 12:00 pm

Every analog designer needs a foundry PDK (Process Design Kits) and EDA tools to design, layout and verify their AMS chip or IP. This week I had a chance to conduct an email interview with Taek-Soo Kim, VP of Technical Engineering at Dongbu HiTek in Korea. This specialty foundry supplies analog silicon worldwide.

Interview
Q: Tell… Read More


Interview with Eric Esteve IPNest made by Synopsys

Interview with Eric Esteve IPNest made by Synopsys
by Eric Esteve on 10-27-2011 at 11:15 am

Introduction from Hezi Saar: Eric’s latest viewpoints and reports are host onIPnestas well as on Semiwikiand you can find information related to various Interface IP: USB 3.0, PCIe, SATA, DDRn, MIPI, HDMI and more.

Q: Eric, give us a quick introduction about your background as it relates to interface IP
A: I have spent 20 years workingRead More


Parasitic Extraction—My Head Hurts!

Parasitic Extraction—My Head Hurts!
by glforte on 10-27-2011 at 10:08 am

By Carey Robertson, Director of Product Marketing, Mentor Graphics

IC physical verification requires a number of different types of checking, the most familiar being design rule checking (DRC), layout vs. schematic (LVS) checking, and parasitic extraction combined with circuit simulation. Fundamentally, it does not matter… Read More


ARM TechCon 2011 Trip Report and Sailing Semiconductors!

ARM TechCon 2011 Trip Report and Sailing Semiconductors!
by Daniel Nenni on 10-26-2011 at 9:37 pm

This was my first ARM TechCon, they cordially invited me as media, but it certainly was not what I expected. Making matters worse, I had literally just flown in from a very long weekend sailing in Mexico which was much more interesting and certainly made me much less tolerant of sales and marketing nonsense. My Uncle Jim lives on a sailboat… Read More


Synopsys Journal, now on Itunes

Synopsys Journal, now on Itunes
by Paul McLellan on 10-24-2011 at 9:42 am

Synopsys Journal is a quarterly publication for management dedicated to covering the latest issues facing designers today. It has been published now for two and a half years. Of course, you can go here and, once registered, get a copy of the journal.

But people don’t have a lot of time to read a journal like this so it has been … Read More


Noise Coupling

Noise Coupling
by Paul McLellan on 10-24-2011 at 8:47 am

One of the challenges of designing a modern SoC is that the digital parts of the circuit are really something that in an ideal world you’d keep as far away from the analog as possible. The digital parts of the circuit generate large amounts of noise, especially in the power supply and in the substrate, two areas where it is impossible… Read More


TSMC 2011 Open Innovation Platform Ecosystem Forum Trip Report

TSMC 2011 Open Innovation Platform Ecosystem Forum Trip Report
by Daniel Nenni on 10-23-2011 at 3:00 pm

The TSMC OIP conference was Monday and Tuesday of last week. You have probably NOT read about it since it was invitation only and press was not invited. Slides were not made available (except for Mentor), no photos or video were allowed, it was a very private affair. Given that, I won’t be able to go into great detail but I will give you… Read More


Oct 27 – Hands-on Workshop with Calibre: DRC, LVS, DFM, xRC, ERC (Fremont, California)

Oct 27 – Hands-on Workshop with Calibre: DRC, LVS, DFM, xRC, ERC (Fremont, California)
by Daniel Payne on 10-20-2011 at 9:56 am

I’ve blogged about the Calibre family of IC design tools before:

Smart Fill replaced Dummy Fill Approach in a DFM Flow

DRC Wiki

Graphical DRC vs Text-based DRC

Getting Real time Calibre DRC Results with Custom IC Editing

Transistor-level Electrical Rule Checking

Who Needs a 3D Field Solver for IC Design?

Prevention is BetterRead More