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Emulation from In Circuit to In Virtual

Emulation from In Circuit to In Virtual
by Bernard Murphy on 11-08-2018 at 7:00 am

At a superficial level, emulation in the hardware design world is just a way to run a simulation faster. The design to be tested runs on the emulator, connected to whatever test mechanisms you desire, and the whole setup can run many orders of magnitude faster than it could if the design was running inside a software simulator. And … Read More


Solving and Simulating in the New Virtuoso RF Solution

Solving and Simulating in the New Virtuoso RF Solution
by Tom Simon on 10-30-2018 at 12:00 pm

Cadence has done a good job of keeping up with the needs of analog RF designs. Of course, the term RF used to be reserved for a thin slice of designs that were used specifically in RF applications. Now, it covers things like SerDes for networking chips that have to operate in the gigahertz range. Add that to the trend of combining RF and… Read More


IBIS-AMI Model Generation Simplified

IBIS-AMI Model Generation Simplified
by Tom Dillinger on 10-25-2018 at 12:00 pm

The increasing demand for data communication throughput between system components has driven the requirement for faster SerDes IP data rates. The complexity of the transmit (Tx) and receive (Rx) signal conditioning functions has correspondingly evolved. As a result, the simulation methodology for SerDes electrical interface… Read More


Meeting Analog Reliability Challenges Across the Product Life Cycle

Meeting Analog Reliability Challenges Across the Product Life Cycle
by Daniel Payne on 08-14-2018 at 12:00 pm

Create a panel discussion about analog IC design and reliability and my curiosity is instantly piqued, so I attended a luncheon discussion at #55DAC moderated by Steven Lewis of Cadence. The panelists were quite deep in their specialized fields:… Read More


A True Signoff for 7nm and Beyond

A True Signoff for 7nm and Beyond
by Alex Tan on 08-13-2018 at 12:00 pm

The Tale of Three Metrics
Meeting PPA (Performance, Power and Area) target is key to a successful design tapeout. These mainstream QoR (Quality of Results) metrics are rather empirical yet inter-correlated and have been expanded to be linked with other metrics such as yield, cost and reliability. While the recent CPU performance… Read More


Cadence Update on AMS Design and Verification at #55DAC

Cadence Update on AMS Design and Verification at #55DAC
by Daniel Payne on 08-06-2018 at 12:00 pm

As a blogger in the EDA industry I get more invitations to meet with folks at DAC than I have time slots, so I have to be a bit selective in who I meet. When the folks at Cadence asked me to sit down and chat with Mladen Nizic I was intrigued because Mladen is so well-known in the AMS language area and he’s one of the authors of, The Mixed-SignalRead More


An update on the Design Productivity Gap

An update on the Design Productivity Gap
by Tom Dillinger on 08-03-2018 at 12:00 pm

Over a decade ago, a group of semiconductor industry experts published a landmark paper as part of the periodic updates to the International Technology Roadmap for Semiconductors, or ITRS for short (link). The ITRS identified a critical design productivity gap. The circuit capacity afforded by the Moore’s Law pace of technology… Read More


Verification Importance in Academia

Verification Importance in Academia
by Alex Tan on 07-31-2018 at 12:00 pm

“Testing can only prove the presence of bugs, not their absence,” stated the famous computer scientist Edsger Dijkstra. That notion rings true to the many college participants of the Hack@DAC competition offered during DAC 2018 in San Francisco. The goal of this competition is to develop tools and methods for identifying security… Read More


Cadence Selected to Support Major DARPA Program

Cadence Selected to Support Major DARPA Program
by Bernard Murphy on 07-26-2018 at 7:00 am

When DARPA plans programs, they’re known for going big – really big. Which is what they are doing again with their Electronics Resurgence Initiative (ERI). Abstracting from their intro, this is a program “to ensure far-reaching improvements in electronics performance well beyond the limits of traditional scaling”. This isn’t… Read More


Cadence’s Smarter and Faster Verification in the Era of Machine Learning, AI, and Big Data Analytics Panel

Cadence’s Smarter and Faster Verification in the Era of Machine Learning, AI, and Big Data Analytics Panel
by Camille Kokozaki on 07-11-2018 at 12:00 pm

I attended on Monday, June 25, DAC’s Opening Day, a Cadence-sponsored Lunch panel. Ann Steffora Mutschler (Semiconductor Engineering) was the Moderator and the Panelists were Jim Hogan (Vista Ventures), David Lacey (HP Enterprise), Shigeo Oshima (Toshiba Memory Corp), Paul Cunningham (Cadence).… Read More