yieldHUB is a SaaS company that provides yield management and comprehensive data analysis for semiconductor (IDMs and fabless) companies around the world. SemiWiki has been working with yieldHUB for the past three years doing blogs, webinars, and podcasts with great success. John O’Donnel spent 18 years at Analog Devices… Read More
International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test… Read More
About Us
International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis,
Monday, September 26, 2022 | 6:30 p.m. to 10:00 p.m.
The Westin Anaheim Resort
All members of the design and test community are invited to attend Synopsys 28th Annual Test & SLM Special Interest Group (SIG) at the 2022 International Test Conference (ITC). This year’s event will be hosted by Dr. Ken Butler, Senior Director … Read More
The 50th International Test Conference was just held in Washington DC, where papers, sessions, workshops and announcements addressing the increasing complexity and expanding use of semiconductors showed that innovations in test are crucial to design and product success. Test methodologies and even the scope of test have … Read More
Every year certain technology themes appear, like at ITC this year a big theme was how to reduce the cost of SoC testing. I spoke with Rob Knoth of Cadence by phone to hear more about this cost of test theme. Rob gave me an example of an SoC that takes 27 seconds on a tester, so at $0.04 per second in test costs amounts to $1.08 per part. If you… Read More
In the early days of IC design there were arguments against using any extra transistors or gates for testability purposes, because that would be adding extra silicon area which in turn would drive up the costs of the chip and product. Today we are older and wiser, realizing that there are product pricing benefits to quickly test each… Read More
The NFL has its annual Super Bowl contest each year, EDA vendors attend DAC, then the test folks attend ITCwhich was in Anaheim a few weeks ago. I’ve marketed ATGP, BIST and DFT tools before so I like to keep updated on what’s happening at conferences like ITC. Robert Ruiz from Synopsys spoke with me by phone to provide … Read More
If you’ll be at ITC TestWeek in Seattle (Oct 20-23), here’s one event you don’t want to miss: a technology reception hosted by Mentor, with Janusz Rajski and Nilanjan Mukherjee as the featured speakers. It is free to ITC attendees and you can register here. [If for some crazy reason you haven’t registered for ITC yet, do that… Read More
At the ITC test conference in early September, Mentor made three announcements. ITC is a big event for Mentor’s test group, and where they usually roll out their new tools and capabilities. The indefatigable Steve Pateras was captured on film describing them.
I’ve summarize Mentor’s three announcements and added… Read More
