For decades we have used a model of faults in chips that assumes that a given signal is stuck-at-0 or stuck-at-1. And when I say decades, I mean it. The D-algorithm was invented at IBM in 1966, the year after Gordon Moore made a now very famous observation about the number of transistors on an integrated circuit. We know that stuck-at… Read More
Somehow, when designing a chip it is synthesis and place & route that gets all the attention. But it is no good taping out perfect layout without also having away to test the silicon. Somehow, test just isn’t as glamorous.
On September 10-12th is the International Test Conference which, as usual, is at the Disneyland Hotel… Read More
Most of us live perfectly good lives without distinction, fame, or note. Others rack up the honors, filling their walls and resumes with recognition of their brilliance. Like Dr. Janusz Rajski.
Rajski is the director of engineering for the test products at Mentor Graphics, an IEEE Fellow, and the inventor of embedded deterministic… Read More
