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Getting to IP Functional Signoff

Getting to IP Functional Signoff
by Bernard Murphy on 06-01-2017 at 7:00 am
Categories: Cadence, EDA

In the early days of IP reuse and platform-based design there was a widely-shared vision of in-house IP development teams churning out libraries of reusable IP, which could then be leveraged in many different SoC applications. This vision was enthusiastically pursued for a while; this is what drove reusability standards and … Read More

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Embedded FPGA IP update — 2nd generation architecture, TSMC 16FFC, and a growing customer base

Embedded FPGA IP update — 2nd generation architecture, TSMC 16FFC, and a growing customer base
by Tom Dillinger on 05-31-2017 at 12:00 pm
Categories: eFPGA, Flex Logix, FPGA, IP

Regular Semiwiki readers are aware that embedded FPGA (eFPGA) IP development is a rapidly growing (and evolving) technical area. The applications for customizable and upgradeable logic in the field are many and diverse — as a result, improved performance, greater configurable logic capacity/density, and comprehensive… Read More

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RTL Correct by Construction

RTL Correct by Construction
by Bernard Murphy on 05-31-2017 at 7:00 am
Categories: Defacto Technologies, EDA

Themes in EDA come in waves and a popular theme from time to time is RTL signoff. That’s a tricky concept; you can’t signoff RTL in the sense of never having to go back and change the RTL. But the intent is still valuable – to get the top-level or subsystem-level RTL as well tested as possible, together with collateral data (SDC, UPF, etc)… Read More

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Consolidation and Design Data Management

Consolidation and Design Data Management
by Bernard Murphy on 05-30-2017 at 7:00 am
Categories: Consensia, EDA, Events
4 Comments

Consensia, a Dassault Systemès channel partner, recently hosted a webinar on DesignSync, a long-standing pillar of many industry design flows (count ARM, Qualcomm, Cavium and NXP among their users). A motivation for this webinar was the impact semiconductor consolidation has had on the complexity of design data management,… Read More

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Understanding Sources of Clock Jitter Critical for SOC’s

Understanding Sources of Clock Jitter Critical for SOC’s
by Tom Simon on 05-29-2017 at 12:00 pm
Categories: IP, Silicon Creations
2 Comments

Jitter issues in SOC’s reside at the crossroads of analog and digital design. Digital designers would prefer to live in a world of clocks that are free from jitter effects. At the same time, analog designers can build PLL’s that are precise and finely tuned. However, when a perfectly working PLL is inserted into an SOC, things can … Read More

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FD-SOI in Japan?

FD-SOI in Japan?
by Adele Hars on 05-27-2017 at 7:00 pm
Categories: Automotive, FD-SOI, IoT

If you want to get your finger on the Japan FD-SOI pulse, registration is still open for a free, two-day workshop in Tokyo this week organized by the SOI Consortium. This is the 3rd Annual SOI Tokyo Workshop, and there’s a really interesting line-up of speakers.

In case you’re wondering, Japan is doing FD-SOI. In fact… Read More

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Webinar -New Concepts in Semiconductor IP Lifecycle Management

Webinar -New Concepts in Semiconductor IP Lifecycle Management
by Daniel Payne on 05-26-2017 at 7:00 am
Categories: EDA, Events, Perforce

The semiconductor IP market continues growing at a healthy rate, and IP reuse is a staple of all modern SoC designs. Along with the acceptance of IP reuse comes a host of growing challenges, like:

  • Increase in design files
  • Increase in meta-data
  • More links between design members worldwide
  • More links between data in multiple engineering
… Read More
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Three Major Challenges Facing IoT

Three Major Challenges Facing IoT
by Ahmed Banafa on 05-25-2017 at 12:00 pm
Categories: IoT

The Internet of Things (IoT) — a universe of connected things providing key physical data and further processing of that data in the cloud to deliver business insights— presents a huge opportunity for many players in all businesses and industries . Many companies are organizing themselves to focus on IoT and the connectivity of… Read More