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Intel Best Practices for Formal Verification

Intel Best Practices for Formal Verification
by Daniel Nenni on 04-07-2022 at 6:00 am

formal dynamic verification comparison

Dynamic event-based simulation of RTL models has traditionally been the workhorse verification methodology.  A team of verification engineers interprets the architectural specification to write testbenches for various elements of the design hierarchy.  Test environments at lower levels are typically exercised then … Read More


TSMC’s Reliability Ecosystem

TSMC’s Reliability Ecosystem
by Tom Dillinger on 04-06-2022 at 10:00 am

AC accelerated stress conditions

TSMC has established a leadership position among silicon foundries, based on three foundational principles:

  • breadth of technology support
  • innovation in technology development
  • collaboration with customers

Frequent SemiWiki readers have seen how these concepts have been applied to the fabrication and packaging technology… Read More


Synopsys Tutorial on Dependable System Design

Synopsys Tutorial on Dependable System Design
by Bernard Murphy on 04-06-2022 at 6:00 am

Dependability

Synopsys hosted a tutorial on the last day of DVCon USA 2022 on design/system dependability. Which here they interpret as security, functional safety, and reliability analysis. The tutorial included talks from DARPA, AMD, Arm Research and Synopsys. DARPA and AMD talked about general directions and needs, Arm talked about their… Read More


The Importance of Low Power for NAND Flash Storage

The Importance of Low Power for NAND Flash Storage
by Tom Simon on 04-05-2022 at 10:00 am

Low Power for NAND Flash

Even though we all know that reducing power consumption in NAND Flash Storage is a good idea, it is worthwhile to take a deeper dive into the underlying reasons for this. A white paper by Hyperstone, a leading developer of Flash controllers, discusses these topics providing useful insight into the problem and its solutions. The … Read More


Security Requirements for IoT Devices

Security Requirements for IoT Devices
by Daniel Nenni on 04-05-2022 at 6:00 am

IoT Product Lifecycles SemiWiki

Designing for secure computation and communication has become a crucial requirement across all electronic products.  It is necessary to identify potential attack surfaces and integrate design features to thwart attempts to obtain critical data and/or to access key intellectual property.  Critical data spans a wide variety… Read More


Designing a FinFET Test Chip for Radiation Threats

Designing a FinFET Test Chip for Radiation Threats
by Tom Simon on 04-04-2022 at 10:00 am

Charged Particles

Much of the technology that goes into aerospace applications is some of the most advanced technology that exists. However, these same systems must also offer the highest level of reliability in what is arguably an extremely difficult environment. For semiconductors a major environmental risk in aerospace applications are … Read More


Bridging Analog and Digital worlds at high speed with the JESD204 serial interface

Bridging Analog and Digital worlds at high speed with the JESD204 serial interface
by Daniel Nenni on 04-04-2022 at 6:00 am

Comcore JESD204 Webinar SemiWiki

We are delighted to showcase our “Bridging Analog and Digital worlds at high speed with the JESD204 Serial Interface” webinar on April 20th, in case you missed the live webinar back in February 2022.

To meet the increased demand for converter speed and resolution, JEDEC proposed the JESD204 standard describing a new efficient … Read More


EUV Resist Absorption Impact on Stochastic Defects

EUV Resist Absorption Impact on Stochastic Defects
by Fred Chen on 04-03-2022 at 10:00 am

EUV Resist Absorption Impact on Stochastic Defects 1

Stochastic defects continue to draw attention in the area of EUV lithography. It is now widely recognized that stochastic issues not only come from photon shot noise due to low (absorbed) EUV photon density, but also the resist material and process factors [1-4].

It stands to reason that resist absorption of EUV light, which is … Read More


A Blanche DuBois Approach Won’t Resolve Traffic Trouble

A Blanche DuBois Approach Won’t Resolve Traffic Trouble
by Roger C. Lanctot on 04-03-2022 at 6:00 am

A Blanche DuBois Approach Wont Resolve Traffic Trouble

Near the end of Tennessee Williams’ “A Streetcar Named Desire” the Blanche DuBois character, who has suffered a mental breakdown following an implied rape, tells the doctor and matron who have come to take her to the hospital: “Whoever you are – I have always depended on the kindness of strangers.” Sadly, this is the… Read More


Cadence and DesignCon – Workflows and SI/PI Analysis

Cadence and DesignCon – Workflows and SI/PI Analysis
by Daniel Nenni on 04-02-2022 at 6:00 am

Clarity 3D solver 112Gbps

DesignCon 2022 is back to a live conference, from Tuesday, April 5th through Thursday, April 7th, at the Santa Clara Convention Center.

Introduction

DesignCon is a unique gathering in our industry.  Its roots incorporated a focus on complex design and analysis requirements of (long-reach) high-speed interfaces.  Technical… Read More