CadenceTECHTALK: Taming the Challenges of Advanced Node Digital Designs

Online

Taming the Challenges of Advanced Node Digital Designs November 10, 2021 Overview Although new challenges arise with each node, the move from bulk technologies to advanced node technologies marks a distinctive shift in complexity. Some of the important factors to consider are new devices, challenging and competing design rules, double patterning, managing of the layout …

SPIE Advanced Lithography + Patterning

San Jose, CA

27 February - 3 March 2022 San Jose, California, United States The conference for emerging technology in the semiconductor industry A conference program has been built with all the great content you expect at SPIE Advanced Lithography + Patterning Prepare to join other leading researchers who are solving challenges in optical and EUV lithography, patterning …