Webinar: Accelerate time to success using smart methods for DFT chip architecture and validation

Online

Combining market-leading design-for-test (DFT) technologies with best-in-class netlist synthesis allows you to achieve DFT success more quickly. Many customers, including those for emulation and IC test, have challenges with scaling architectures. This webinar describes how Siemens emulation and silicon test solutions can work together to provide a smart DFT plug-and-play architecture for Veloce ICs. The …

Ansys Speos + DXOMARK Analyzer Revolutionize Virtual Camera System Validation

Online

Ansys Speos is collaborating with DXOMARK Analyzer, a leading tool for image quality analysis, to revolutionize the validation process of virtual camera systems. This webinar introduces the end-to-end camera solution that integrates physical measurements with simulation. Join us to explore this groundbreaking partnership and learn how it can transform how you assess virtual camera system …