Webinar: Minimize Layout Iterations and EM Errors with Simulation-Driven Routing
Overview Electromigration (EM) has a major impact on IC reliability and lifespan. Long a concern for automotive, aerospace, and healthcare, EM is now a challenge for the entire microelectronics industry as we move to lower process nodes. To address this concern, Cadence built upon its electrically aware design (EAD) technology to create, simulation-driven routing (SDR). …
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