Webinar: Fast and Accurate High-Sigma Analysis with Worst-Case Points

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Advanced semiconductor nanometer technology nodes, together with smart IC design applications enable today very complex and powerful systems for communication, automotive, data transmission, AI, IoT, medical, industry, energy harvesting, and many more. Random variation in the manufacturing process is a challenge for all full custom circuit designers, because their designs must be so insensitive to process variations that a high percentage of manufactured circuits meets their specification. Therefore, all circuit designs must be validated by simulation not only for typical manufacturing conditions, but also under a process model that includes die-to-die and on-chip local variation.

Some designs demand a very high level of robustness such as failure rates below 1 part-per-million, particularly in automotive applications and in memory design. In this webinar we will introduce and explain verification methods beyond brute force Monte Carlo sampling for such high parametric yields. MunEDA’s tool suite WiCkeD provides high-sigma circuit analysis and optimization.

*This webinar is in partnership with SemiWiki and MunEDA

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