Banner Electrical Verification The invisible bottleneck in IC design updated 1
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SpyGlass World 2015 User Group Meeting

SpyGlass World 2015 User Group Meeting
by Bernard Murphy on 10-26-2015 at 4:00 pm

I attended SpyGlass World this week – to give you an update, to catch up with old friends, including users, and to meet some of the new (to me) players from the Synopsys side of the event. The event was held in the United Club at Levi stadium, just like last year. Don’t know if this will continue. Merging the SpyGlass User Group into SNUG… Read More


Free Copy of EDAgraffiti!

Free Copy of EDAgraffiti!
by Daniel Nenni on 10-25-2015 at 12:00 pm

Last month we offered a free PDF version of our book “Fabless: The Transformation of the Semiconductor Industry”, for the greater good. More than thirteen thousand people have downloaded it thus far so we would like to keep the momentum going with another book giveaway. Paul McLellan has graciously offered his book… Read More


Why Your IP Release Methodology Can Make or Break Reuse Success

Why Your IP Release Methodology Can Make or Break Reuse Success
by Tom Simon on 10-24-2015 at 7:00 am

When the term IP first came into popular usage for IC design, it was primarily conceived as blocks of design content that were bought occasionally from external sources. A customer might use one or two in a design, and expect one delivery with perhaps some minor updates before tapeout. Over the last 18 years, this notion has changed… Read More


Simulating Full-System EMI for a Car in Just 28 Minutes

Simulating Full-System EMI for a Car in Just 28 Minutes
by Bernard Murphy on 10-23-2015 at 8:00 pm

While there’s a lot of cool technology in modern semiconductors, it’s important to raise our sights periodically to understand how well these chips will work in the systems for which they are designed. One area driving a lot of semiconductor growth is automobile electronics. We’ve had drive-train control forever it seems, but… Read More


Three New Things from ITC this year

Three New Things from ITC this year
by Daniel Payne on 10-23-2015 at 12:00 pm

The NFL has its annual Super Bowl contest each year, EDA vendors attend DAC, then the test folks attend ITCwhich was in Anaheim a few weeks ago. I’ve marketed ATGP, BIST and DFT tools before so I like to keep updated on what’s happening at conferences like ITC. Robert Ruiz from Synopsys spoke with me by phone to provide … Read More


Why FPGA synthesis with Synplify is now faster

Why FPGA synthesis with Synplify is now faster
by Don Dingee on 10-23-2015 at 7:00 am

The headline of the latest Synopsys press release drops quite a tease: the newest release of Synplify delivers up to 3x faster runtime performance in FPGA synthesis. In our briefing for this post, we uncovered the surprising reason why – and it’s not found in their press release.… Read More


How Virtualization Makes Network Processor Verification Efficient

How Virtualization Makes Network Processor Verification Efficient
by Tom Simon on 10-22-2015 at 7:00 am

When Ethernet was introduced in 1983 it ran at 10Mbps and mostly relied on hubs and coaxial cable. Twelve years later a faster speed was introduced, running at 100Mbps. Since then we have seen an acceleration of new data rate introductions. According top the Ethernet Alliance, Ethernet could have 12 speeds before 2020, with 6 of … Read More


Interconnect Watch: 3 Chip Design Merits for Network Applications

Interconnect Watch: 3 Chip Design Merits for Network Applications
by Majeed Ahmad on 10-21-2015 at 4:00 pm

The countdown to the end of Moore’s Law is coinciding with the rising complexity in system-on-chip (SoC) designs. And that’s not a mere coincidence. The leverage that has long been coming from shrinking process nodes in terms of cost, performance and power benefits is now increasingly being accomplished through… Read More


Price of Admission $0.00 at Inaugural Silicon Valley Conference

Price of Admission $0.00 at Inaugural Silicon Valley Conference
by Beth Martin on 10-20-2015 at 7:00 am

Back in 2002, the Southwest DFT Conference was born and experts on design for test (DFT) and test got together to share ideas and talk to people in this industry that were trying to solve test challenges of the day.… Read More