2017 in Review and 2018 Forecast

2017 in Review and 2018 Forecast
by Daniel Nenni on 12-30-2017 at 7:00 am

This has been an amazing year for me both personally and professionally. Personally we are now empty nest and have our first grandchild. SemiWiki is prospering, a company that I have been involved with for ten years (Solido Design) had a very nice exit, and my time promoting semiconductor stocks to Wall Street paid off with the PHLXRead More


IEDM 2017 – Intel Versus GLOBALFOUNDRIES at the Leading Edge

IEDM 2017 – Intel Versus GLOBALFOUNDRIES at the Leading Edge
by Scotten Jones on 12-22-2017 at 9:00 am

As I have discussed in previous blogs, IEDM is one of the premier conferences to learn about the latest developments in semiconductor technology. … Read More


High Calibre Development Keeps Mentor on Top of the Game

High Calibre Development Keeps Mentor on Top of the Game
by Tom Simon on 12-07-2017 at 12:00 pm

One might be tempted to think that technology driven gains in computer performance might be enough to keep up with the needs of design and verification tools. We know that design complexity is increasing at a rate predicted by Moore’s Law. We also know that the performance of the computers used during IC development benefit from … Read More


ASIC and TSMC are the AI Chip Unsung Heroes

ASIC and TSMC are the AI Chip Unsung Heroes
by Daniel Nenni on 11-20-2017 at 7:00 am

One of the more exciting design start market segments that we track is Artificial Intelligence related ASICs. With NVIDIA making billions upon billions of dollars repurposing GPUs as AI engines in the cloud, the Application Specific Integrated Circuit business was sure to follow. Google now has its Tensor Processing Unit, Intel… Read More


TSMC EDA 2.0 With Machine Learning: Are We There Yet ?

TSMC EDA 2.0 With Machine Learning: Are We There Yet ?
by Alex Tan on 11-06-2017 at 7:00 am

Recently we have been swamped by news of Artificial Intelligence applications in hardware and software by the increased adoption of Machine Learning (ML) and the shift of electronic industry towards IoT and automobiles. While plenty of discussions have covered the progress of embedded intelligence in product roll-outs, anRead More


Deep Learning and Cloud Computing Make 7nm Real

Deep Learning and Cloud Computing Make 7nm Real
by Daniel Nenni on 11-05-2017 at 7:00 am

The challenges of 7nm are well documented. Lithography artifacts create exploding design rule complexity, mask costs and cycle time. Noise and crosstalk get harder to deal with, as does timing closure. The types of applications that demand 7nm performance will often introduce HBM memory stacks and 2.5D packaging, and that creates… Read More


Choosing the lesser of 2 evils EUV vs Multi Patterning!

Choosing the lesser of 2 evils EUV vs Multi Patterning!
by Robert Maire on 11-03-2017 at 12:00 pm

For Halloween this week we thought it would be appropriate to talk about things that strike fear into the hearts of semiconductor makers and process engineers toiling away in fabs. Do I want to do multi-patterning with the huge increase in complexity, number of steps, masks and tools or do I want to do EUV with unproven tools, unproven… Read More


Arm TechCon Preview with the Foundries!

Arm TechCon Preview with the Foundries!
by Daniel Nenni on 10-23-2017 at 9:00 am

This week Dr. Eric Esteve, Dr. Bernard Murphy, and I will be blogging live from Arm TechCon. It really looks like it will be a great conference so you should see some interesting blogs in the coming days. One of the topics I am interested in this year is foundation IP and I will tell you why.

During the fabless transformation of the semiconductor… Read More


TSMC: Semiconductors in the next ten years!

TSMC: Semiconductors in the next ten years!
by Daniel Nenni on 10-23-2017 at 6:00 am

The TSMC 30th Anniversary Forum just ended so I will share a few notes before the rest of the media chimes in. The forum was live streamed on tsmc.com, hopefully it will be available for replay. The ballroom at the Grand Hyatt in Taipei was filled with cameras, semiconductor executives, and security personnel.

Here is the replay

The… Read More


Reliability Signoff for FinFET Designs

Reliability Signoff for FinFET Designs
by Bernard Murphy on 10-17-2017 at 7:00 am

Ansys recently hosted a webinar on reliability signoff for FinFET-based designs, spanning thermal, EM, ESD, EMC and aging effects. I doubt you’re going to easily find a more comprehensive coverage of reliability impact and analysis solutions. If you care about reliability in FinFET designs, you might want to check out this webinar.… Read More