Lithography Resolution Limits: Paired Features

Lithography Resolution Limits: Paired Features
by Fred Chen on 04-07-2020 at 10:00 am

Lithography Resolution Limits Paired Features

As any semiconductor process advances to the next generation or “node”, a sticky point is how to achieve the required higher resolution. As noted in another article [1], multipatterning (the required use of repeated patterning steps for a particular feature) has been practiced already for many years, and many have… Read More


The Need for Low Pupil Fill in EUV Lithography

The Need for Low Pupil Fill in EUV Lithography
by Fred Chen on 03-15-2020 at 10:00 am

The Need for Low Pupil Fill in EUV Lithography 1

Extreme ultraviolet (EUV) lithography targets sub-20 nm resolution using a wavelength range of ~13.3-13.7 nm (with some light including DUV outside this band as well) and a reflective ring-field optics system. ASML has been refining the EUV tool platform, starting with the NXE:3300B, the very first platform with a numerical

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Lithography For Advanced Packaging Equipment

Lithography For Advanced Packaging Equipment
by Robert Castellano on 06-24-2019 at 10:00 am

Advanced IC packaging, such as fan-out WLP (Wafer Level Packaging) and 2.5D TSV (Through Silicon Via) will drive the packaging equipment market, particularly lithography. This will help specific equipment manufacturers in 2019, since the WFE (Wafer Front End) market will drop 17%. But the Back-End lithography market, led … Read More


imec and Cadence on 3nm

imec and Cadence on 3nm
by Daniel Nenni on 04-30-2018 at 7:00 am

One of the more frequent questions I get, “What is next after FinFETs?” is finally getting answered. Thankfully I am surrounded by experts in the process technology field including Scotten Jones of IC Knowledge. I am also surrounded by design enablement experts so I really am the man in the middle which brings us to a discussion between… Read More


SPIE Advanced Lithography and Synopsys!

SPIE Advanced Lithography and Synopsys!
by Daniel Nenni on 02-01-2017 at 7:00 am

SPIE is the premier event for lithography held in Silicon Valley and again Scotten Jones and I will be attending. EUV is generally the star of the show and this year will be no different now that TSMC has committed to EUV production in 2019.

Last year at SPIE, TSMC presented the history of EUV development from the beginning in 1985 as … Read More


Mentor’s Battle of the Photonic Bulge

Mentor’s Battle of the Photonic Bulge
by Mitch Heins on 12-07-2016 at 4:00 pm

A few weeks back I wrote an article mentioning that Mentor Graphics has been quietly working on solutions for photonic integrated circuits (PICs) for some time now, while one of their competitors has recently established a photonics beachhead. One of the most common challenges for PIC designs is their curvilinear nature, thus… Read More


Layout Pattern Matching for DRC, DFM, and Yield Improvement

Layout Pattern Matching for DRC, DFM, and Yield Improvement
by Tom Dillinger on 06-01-2016 at 12:00 pm

It is truly amazing to consider the advances in microelectronic process development, using 193i photolithography. The figure below is a stark reminder of the difference between the illuminating wavelength and the final imaged geometries. This technology evolution has been enabled by continued investment in mask data generation… Read More


The Semicon Industry Keeps Wafer Fabs Moving Up

The Semicon Industry Keeps Wafer Fabs Moving Up
by Pawan Fangaria on 04-20-2016 at 7:00 am

The worldwide revenue of semiconductor industry has remained flat in last few years; to be more precise, overall semiconductor revenue declined by 1.9% in 2015 and Gartner forecasts it to further decline by 0.6% in 2016. The total revenue was at record high of $340.3 billion in 2014.

Well, semiconductor industry has matured. A … Read More