Xilinx & Apache Team up for FPGA Reliability at 20nm

Xilinx & Apache Team up for FPGA Reliability at 20nm
by Pawan Fangaria on 03-17-2014 at 12:00 am

In this age of SoCs with hundreds of IPs from different sources integrated together and working at high operating frequencies, FPGA designers are hard pressed keeping up the chip reliability from issues arising out of excessive static & dynamic IR drop, power & ground noise, electro migration and so on. While the IPs are… Read More


Dual Advantage of Intelligent Power Integrity Analysis

Dual Advantage of Intelligent Power Integrity Analysis
by Pawan Fangaria on 02-03-2014 at 9:30 am

Often it is considered safer to be pessimistic in estimating IR-drop to maintain power integrity of semiconductor designs; however that leads to the use of extra buffering and routing resources which may not be necessary. In modern high speed, high density SoCs having multiple blocks, memories, analog IPs with different functionalities… Read More


Power integrity: ground, and other fairy tales

Power integrity: ground, and other fairy tales
by Don Dingee on 03-31-2013 at 8:30 pm

Ground. It’s that little downward-pointing triangle that somehow works miracles on every schematic. It looks very simple until one has to tackle modern power distribution network (PDN) design on a board with high speed and high power draw components, and you soon discover ground is a complicated fairy tale with a lot of influences.… Read More


IC Custom IP Blocks – EM and IR Drop Effects

IC Custom IP Blocks – EM and IR Drop Effects
by Daniel Payne on 03-06-2012 at 5:33 pm

Designing custom IP blocks is a challenge at the transistor-level and I wanted to learn what the recommended methodology and EDA tool flow was at Synopsys. They have a webinar that you can register for and it takes 30 minutes to learn what they have to say, or you can read a White Paper. If you cannot spare that much time, then my summary… Read More