The recent launch of the Open Connectivity Foundation (OCF) was met first with a wave of “oh good, another IoT consortium”, then “phew, it’s just a rebrand of the OIC”, followed by a bit of confusion over why a few AllSeen Alliance players and some other names jumped in. Is it just a marketing ploy, or is there more to this?… Read More
Tag: ieee
Challenges in IP Qualification with Rising Physical Data
With every new technology node, there are newer physical effects that need to be taken into account. And every new physical effect brings with itself several new formats to model them. Often a format is also associated with several of its derivatives, sometimes an standard reincarnation of a proprietary format further evolved… Read More
IEDM 2015 Blogs – Part 1 – Overview
The International Electron Devices Meeting (IEDM) is one of, if not the premier conference for semiconductor process technology. The 2015 meeting just finished up on Wednesday, December 9th.
This year’s meeting was held from Saturday, December 5[SUP]th[/SUP] through Wednesday, December 9[SUP]th[/SUP] in Washington DC.… Read More
IEEE S3S Rump Session: “What Does IoT Mean for Si Technology?”
For the second year in the row, Gartner’s Emerging Technologies Hype Cycle puts Internet of Things (IoT) at the Peak of Inflated Expectations. Not only many online forums are inflated with debates on IoT-related topics, but more importantly virtually all semiconductor companies made announcement pertaining their plans to … Read More
My Tryst with Semiconductors and EDA
Yes, today I realize it feels like a tryst with semiconductors. In actual meaning; it wasn’t a love affair with semiconductors, but I must say the greatest thing it taught me about how it approaches towards perfection. And that became the guiding principle in my life; how can I do something better. Of course nothing is perfect in life… Read More
My Candid Conversation with Karen Bartleson
If you don’t know about Karen Bartleson, before I get into details, let me tell you that she was the President of IEEE-SA for the past 2 years and has been nominated by the IEEE Board of Directors as one of the candidates for IEEE President-Elect for 2016. The IEEE is an organization I admire as it plays a key role in advancing technology… Read More
Power Management Gets Tricky in IP Driven World
Today, an SoC can have multiple instances of an IP and also instances of many different IPs from different vendors. Every instance of an IP can work in a separate mode and requires a dedicated power arrangement which may only be formalized at the implementation stage. The power intent, if specified earlier, will need to be re-generated… Read More
Physically Aware DFT Improves PPA
Introducing on-chip test circuitry has become a necessary criteria for an ASIC’s post manufacture testability. The test circuitry is usually referred as DFT (Design-for-Test) circuit. A typical methodology for introducing DFT circuit in a design is to replace usual flip-flops with special types of flip-flops called ‘scan… Read More
A Comprehensive Automated Assertion Based Verification
Using an assertion is a sure shot method to detect an error at its source, which may be buried deep within a design. It does not depend on a test bench or checker, and can fire automatically as soon as a violation occurs. However, writing assertions manually is very difficult and time consuming. To do so require deep design and coding… Read More
Measuring Metastability
Measuring metastability is just 50 years old this year. In 1965 my colleague Tom Chaney took a sampling ‘scope picture of an ECL flip-flop going metastable. S. Lubkin had made mention of the phenomenon over a decade before that, but at that time most engineers were unaware of the phenomenon or did not believe it actually existed. … Read More