IEEE International Electron Devices Meeting (IEDM) 2024

IEEE International Electron Devices Meeting (IEDM) 2024
by Admin on 02-26-2024 at 7:26 pm

IEEE International Electron Devices Meeting (IEDM) is the world’s preeminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling. IEDM is the flagship conference for nanometer-scale CMOS transistor technology,… Read More


IRPS 2024

IRPS 2024
by Admin on 02-12-2024 at 4:47 pm

About IRPS

IEEE International Reliability Physics Symposium (IRPS) is the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the… Read More


Seventh Annual Symposium on Heterogeneous Integration Roadmap and Annual Meeting

Seventh Annual Symposium on Heterogeneous Integration Roadmap and Annual Meeting
by Admin on 02-12-2024 at 4:44 pm

IEEE vTools Events is more than just a place to report past meeting activity. It is an event management tool that enables IEEE Sections, Subsections, Chapters, Affinity Groups and Student Branches to schedule, promote and report (L31) IEEE meetings and events.

vTools Events also offers event registration which, if setup, will… Read More


1st IEEE RAS in Data Centers Summit

1st IEEE RAS in Data Centers Summit
by Admin on 01-29-2024 at 3:51 pm

RAS in the Data Center

A new international industry-focused summit that brings together academic researchers and industry technology leaders to share their vision and thought-leadership on the toughest Reliability, Availability and Serviceability (RAS) challenges facing the data center market now and in the future. Emphasizing

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IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS (PAINE)

IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS (PAINE)
by Admin on 12-18-2023 at 9:54 pm

About PAINE

Physical inspection of electronics has grown significantly over the past decade and is becoming a major focus for the chip designers, original equipment manufacturers, and system developers. The complex long life of the electronic devices coupled with their diverse applications is making them increasingly vulnerable

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42nd IEEE VLSI Test Symposium 2024

42nd IEEE VLSI Test Symposium 2024
by Admin on 12-06-2023 at 4:42 pm

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield, reliability, and security of microelectronic circuits and systems.

The symposium will take place on April 22-24 2024, in Tempe, AZ, USA.
The program includes keynotes, scientific paper presentations, short industrial… Read More


2024 IEEE Custom Integrated Circuits Conference (CICC)

2024 IEEE Custom Integrated Circuits Conference (CICC)
by Admin on 12-06-2023 at 4:37 pm

About CICC

The IEEE Custom Integrated Circuits Conference is a premier conference devoted to IC development. The conference program is a blend of oral presentations, exhibits, panels and forums. The conference sessions present original first published technical work and innovative circuit techniques that tackle practical

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