Functional Safety – What and How

Functional Safety – What and How
by Daniel Payne on 05-26-2021 at 10:00 am

Accellera FSWG min

I’ve written before about how the automotive industry adheres to functional safety (FS) as defined in the ISO 26262 standard, along with other SemiWiki bloggers. That standard certainly defines the What part of FS, however it doesn’t mandate how you meet the standard, what tools you should be using, file formats … Read More


Tracing Technology’s Evolution with Patents

Tracing Technology’s Evolution with Patents
by Arabinda Das on 04-23-2020 at 10:00 am

Figure 1

We live in an age of abundant information. There is a tremendous exchange of ideas crisscrossing the world enabling new innovative type of products to pop up daily. Therefore, in this era there is a greater need to understand competitive intelligence. Corporate companies today are interested in what other competitors are brewing… Read More


IEDM 2019 to Highlight Innovative Devices for an Era of Connected Intelligence

IEDM 2019 to Highlight Innovative Devices for an Era of Connected Intelligence
by Scotten Jones on 08-28-2019 at 6:00 am

The IEEE International Electron Devices Meeting is in my opinion the leading technology conference to understand the current state-of-the-art in semiconductor process technology. Held each year in early December in San Francisco it is a must attend conference for anyone following technology development. The following is… Read More


Accelerating Design and Manufacturing at the 25th Annual IEEE Electronic Design Process Symposium

Accelerating Design and Manufacturing at the 25th Annual IEEE Electronic Design Process Symposium
by Camille Kokozaki on 09-05-2018 at 12:00 pm

25th annual IEEE Electronic Design Process Symposium
Accelerating Design and Manufacturing
September 13 & 14, 2018, SEMI, 673 S. Milpitas Blvd, Milpitas, CA 95035

This year marks a milestone in EDPS’s history as it turns 25. The event will be held at SEMI’s new headquarter facility and will provide a forum for EDA, foundry … Read More


Attending DAC in Austin for Free

Attending DAC in Austin for Free
by Daniel Payne on 04-23-2017 at 7:00 am

I’ve been attending DAC since the late 1980’s and can tell you that it’s an annual highlight for me and anyone else interested in the EDA, IP and semiconductor industries. Where else can you see most of the big and little vendors of EDA software, semiconductor IP and foundries in one place? I recently blogged aboutRead More


OEMs Lead the Way on Self Driving Tech

OEMs Lead the Way on Self Driving Tech
by Roger C. Lanctot on 02-25-2017 at 7:00 am

It’s never a good sign when car makers are called before Congress. It’s almost as bad as being asked to visit the President. But last week the meeting didn’t involve allegations or investigations. It was just an occasion for a friendly chat regarding “Self-Driving Cars: Road to Deployment.”

IEEE
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IoT Standardization and Implementation Challenges

IoT Standardization and Implementation Challenges
by Ahmed Banafa on 11-15-2016 at 12:00 pm

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The rapid evolution of the #IoT market has caused an explosion in the number and variety of IoT solutions. Additionally, large amounts of funding are being deployed at IoT startups. Consequently, the focus of the industry has been on manufacturing and producing the right types of hardware to enable those solutions. In current … Read More


Why are Top Brass from NXP, Qualcomm, Skyworks Keynoting Upcoming IEEE SOI-3D-SubVt (S3S) Conference? (San Francisco, Oct.’16)

Why are Top Brass from NXP, Qualcomm, Skyworks Keynoting Upcoming IEEE SOI-3D-SubVt (S3S) Conference? (San Francisco, Oct.’16)
by Adele Hars on 08-25-2016 at 12:00 pm

By Fred Allibert
The IEEE S3S Conference (10-13 October 2016 at the San Francisco Airport Hyatt Regency) brings together 3 key technologies that will play a major role in tomorrow’s industry: SOI, 3D integration, and Subthreshold Microelectronics. The numerous degrees of freedom they allow enable the ultra-low power operation… Read More


At What Point Does Transistor Gate Length Stop Getting Smaller?

At What Point Does Transistor Gate Length Stop Getting Smaller?
by Daniel Payne on 08-03-2016 at 12:00 pm

When I started doing IC design back in 1978 we had 6,000 nm channel gate lengths, and today you can buy a smart phone with 16 nm or 14 nm technology, although the gate lengths in those phones are more like 34 nm. The International Technology Roadmap for Semiconductors (ITRS) makes predictions about emerging trends in our industry and… Read More