10th Edition — IEEE International Test Conference INDIA 2026
International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.
At IEEE ITC India, design, test, and yield professionals can confront challenges faced by the industry, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
Who should attend?
Students, researchers, faculty, and industry professionals in VLSI, semiconductor testing, and electronics are encouraged to attend.
It is ideal for anyone interested in chip design, validation, and emerging test technologies.
Is the conference fully offline, virtual, or hybrid?
IEEE ITC India 2026 is primarily an in-person (offline) conference to enable better networking and collaboration.
Some sessions may be accessible in hybrid or virtual mode based on final arrangements.
What are the key focus areas?
The conference covers VLSI testing, DFT, silicon debug, reliability, and hardware security.
It also includes emerging areas like AI in testing and next-gen technologies such as IoT and 5G/6G.
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