Reliability Signoff for FinFET Designs

Reliability Signoff for FinFET Designs
by Bernard Murphy on 10-17-2017 at 7:00 am

Ansys recently hosted a webinar on reliability signoff for FinFET-based designs, spanning thermal, EM, ESD, EMC and aging effects. I doubt you’re going to easily find a more comprehensive coverage of reliability impact and analysis solutions. If you care about reliability in FinFET designs, you might want to check out this webinar.… Read More


Webinar: Signoff for Thermal, Reliability and More in Advanced FinFET designs

Webinar: Signoff for Thermal, Reliability and More in Advanced FinFET designs
by Bernard Murphy on 09-17-2017 at 7:00 am

In automotive applications, advanced FinFET processes are great for high levels of integration and low power. But they also present some new challenges in reliability signoff. Ansys will be hosting a webinar to highlight the challenges faced by engineers trying to ensure thermal, electromigration (EM) and electrostatic discharge… Read More


Simulating ADAS

Simulating ADAS
by Bernard Murphy on 05-04-2017 at 7:00 am

Simulation is a broad technique spanning certainly digital logic and circuit simulation but also methods beyond these which are particularly relevant to ADAS design. In fact, much of the design of full ADAS systems begins and ends with these types of modeling. This is in part due to the need fully validate integrity and reliability… Read More


Integrity and Reliability in Analog and Mixed-Signal

Integrity and Reliability in Analog and Mixed-Signal
by Bernard Murphy on 07-18-2016 at 1:30 pm

In the largest and fastest growing categories in electronics – mobile, IoT and automotive – analog is playing an increasingly important role. It’s important in delivering high integrity power and critical signals to the design though LDO regulators and PLLs, in managing high speed interfaces like DDR and SERDES, in interfacing… Read More


Top Ten #53DAC Highlights

Top Ten #53DAC Highlights
by Tom Dillinger on 06-13-2016 at 12:00 pm

Here is a very subjective list of the Top 10 logistical and technical highlights from DAC’53.

(10) With DAC attendance down from its peak days, the Austin Convention Center served as an excellent venue. There was good participation from companies with design centers in the “Silicon Hills”. And, I saw colleagues from Silicon Valley,… Read More


The Importance of Transistor-Level Verification

The Importance of Transistor-Level Verification
by Students@olemiss.edu on 04-10-2016 at 7:00 am

According to the IEEE Std 1012-2012, verification is the acknowledgement that a product is in satisfactory condition by meeting a set of rigorous criteria. [3] Transistor-level verification involves the use of custom libraries and design models to achieve ultimate performance, low power, or layout density. [2] Prediction… Read More


A Synergistic Chip-Package-System Analysis Methodology

A Synergistic Chip-Package-System Analysis Methodology
by Tom Dillinger on 12-23-2015 at 4:00 pm

Looking back, 2015 was a significant year for mergers and acquisitions in the EDA industry. The Semiwiki team maintains a chronology of major transactions here.

As I was reviewing this compendium, one of the entries that stands out is the acquisition of Apache Design Solutions by Ansys, Inc. a couple of years ago.

At that time, there… Read More


How Magwel is Tapping Tried and True Business Strategy in Targeting ESD

How Magwel is Tapping Tried and True Business Strategy in Targeting ESD
by Tom Simon on 11-02-2015 at 12:00 pm

Often when a company starts out it takes a while for it to find the sweet spot in the marketplace. Very often it is feedback from existing customers and business success that can help point the way for small companies as they grow. This is just as true in EDA as it is in retailing or consumer products. For instance, Mentor Graphics, though… Read More


A Key Partner in the Semiconductor Ecosystem

A Key Partner in the Semiconductor Ecosystem
by Pawan Fangaria on 05-19-2015 at 5:00 pm

Often we hear about isolated instances of excellence from various companies in the semiconductor industry which contribute significantly in building the overall ecosystem. While the individual excellence is essential, it’s rather more important how that excellence is utilized in a larger way by the industry to create a ‘value… Read More


Will your next SoC fail because of power noise integrity in IP blocks?

Will your next SoC fail because of power noise integrity in IP blocks?
by Daniel Payne on 04-14-2015 at 5:00 pm

By the time that your SoC comes back from the fab and you plugin it into a socket on a board for testing, it’s a little late in the cycle to start thinking about reliability concerns like: dynamic voltage drop, noise coupling, EM (Electro-Migration), self-heating, thermal analysis and ESD (Electro-Static Discharge). They… Read More