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Coding Guidelines for Datapath Verification

Coding Guidelines for Datapath Verification
by Bernard Murphy on 06-01-2022 at 6:00 am

multiplier min

It has been an article of faith that you can’t use formal tools to validate datapath logic (math components). Formal is for control logic, not datapath, we now realize. We understood the reason – wide inputs (32-bit, 64-bit or more) fed through a multiplier deliver eye-watering state space sizes. State space explosions also happen… Read More


Importance of an Analytics Platform Before Migrating to the Cloud

Importance of an Analytics Platform Before Migrating to the Cloud
by Kalar Rajendiran on 05-31-2022 at 10:00 am

TCS NeurEDA Advisor Architecture

After many years of hesitancy to jump with both feet in, semiconductor companies are seriously considering implementing cloud strategies and making required investments. Their concern though is, how much investment is it going to take? Some of the block-and-tackle challenges they face in implementing a cloud strategy are … Read More


0.55 High-NA Lithography Update

0.55 High-NA Lithography Update
by Tom Dillinger on 05-31-2022 at 6:00 am

mask infrastructure 0 55

At the recent SPIE Advanced Lithography + Patterning Conference, Mark Phillips from Intel gave an insightful update on the status of the introduction of the 0.55 high numerical aperture extreme ultraviolet lithography technology.  Mark went so far as to assert that the development progress toward high-NA EUV would support … Read More


Using EM/IR Analysis for Efinix FPGAs

Using EM/IR Analysis for Efinix FPGAs
by Daniel Payne on 05-30-2022 at 10:00 am

XLR min

I’ve been following the EM/IR (Electro-Migration, IR is current and resistance) analysis market for many years now, and recently attended a presentation from Steven Chin, Sr. Director IC Engineering of Efinix, at the User2User event organized by Siemens EDA. The Tuesday presentation was in the morning at the Marriott… Read More


Die-to-Die IP enabling the path to the future of Chiplets Ecosystem

Die-to-Die IP enabling the path to the future of Chiplets Ecosystem
by Kalar Rajendiran on 05-30-2022 at 6:00 am

Die to Die Interface Figure of Merit

The topic of chiplets is getting a lot of attention these days. The chiplet movement has picked up more momentum since Moore’s law started slowing down as process technology approached 5nm. With the development cost of a monolithic SoC crossing the $500M and wafer yields of large die-based chips dropping steeply, the decision … Read More


Connecting Everything, Everywhere, All at Once

Connecting Everything, Everywhere, All at Once
by Roger C. Lanctot on 05-29-2022 at 6:00 am

Connecting Everything Everywhere All at Once

The automotive industry is rapidly coming to the realization that connecting cars is about so much more than simply adding a modem, an antenna, and a bit of software. Connecting cars and connecting car owners with an attractive connectivity value proposition may be two of the most difficult things the industry has ever attempted.… Read More


Podcast EP82: The Critical Need for Reliability in Future Products

Podcast EP82: The Critical Need for Reliability in Future Products
by Daniel Nenni on 05-27-2022 at 10:00 am

Dan is joined by Charlie Slayman, technical leader at Cisco Systems working on reliability physics and risk assessment of advanced semiconductor technology. He is also the general chair of the International Reliability Physics Symposium, or IRPS which is the focus of the discussion.

Dan explores the rapidly growing application… Read More


The New Normal for Semiconductor Manufacturing

The New Normal for Semiconductor Manufacturing
by Daniel Nenni on 05-27-2022 at 6:00 am

200mm 300mm Semiconductor Capacity

One of the recent live events I attended was the 2022 GSA Silicon Leadership Summit on May 12th at the Santa Clara Convention Center (my favorite location). This was the first GSA live event in two years so it was a must attend gathering. This event targets semiconductor ecosystem executives (200+ people attended) so there were many… Read More


Methods for Current Density and Point-to-point Resistance Calculations

Methods for Current Density and Point-to-point Resistance Calculations
by Daniel Payne on 05-26-2022 at 10:00 am

ESD path min

IC reliability is an issue that circuit design engineers and reliability engineers are concerned about, because physical effects like high Current Density (CD) in interconnect layers, or high point-to-point (P2P) resistance on device interconnect can impact reliability, timing or Electrostatic Discharge (ESD) robustness.… Read More


Very Short Reach (VSR) Connectivity for Optical Modules

Very Short Reach (VSR) Connectivity for Optical Modules
by Kalar Rajendiran on 05-26-2022 at 6:00 am

Synopsys 112G Ethernet PHY IP for VSR

Bandwidth, latency, power and reach are always the key points of focus when it comes to connectivity. As the demand for more data and higher bandwidth connectivity continue, power management is gaining a lot of attention. There is renewed interest in pursuing silicon photonics to address many of these challenges. There are many… Read More