Join CEA-Leti CEO Sébastien Dauvé and a panel of tech experts and partners at Leti Semicon Workshop on July 9, 2024 – San Francisco CEA-Leti is setting up a novel …
Ensuring reliable performance of products in the field requires verification and validation at the system level. This means considering the complex interaction of different physics between systems and sub-systems. In …
Whether you’re conducting safety analyses at the system, software, or hardware level, medini analyze can help you achieve: Up to 50% increased efficiency in your functional safety analyses, End-to-end traceability, including integration …
Continue reading "ISO 26262 Safety Analysis: Streamline Your Path to Functional Safety"
About The Conference We are delighted to announce the AESIN Conference 2024 to be held on 11th July. This year’s AESIN theme is Collaboration in a technology rich era. We …
Join us at Virtual Prototyping Day 2024 to hear about the latest deployed virtual prototyping innovations. This event highlights applications from around the world using the latest virtual prototyping technology, …
Description Today’s wireless and high-speed chip designs integrate an incredible amount of functionality on very small silicon real estate. Such integration requires optimization from the early stages of the design to post-layout vs. schematic (LVS) signoff. Increasingly complex designs and advanced process nodes test the limits of electromagnetic (EM) solvers in terms of modeling capacity …
Continue reading "Webinar: Chip-Level Electromagnetic Crosstalk Signoff Using EMX Solver"
Summary Join us for a weekly webinar series focusing on cutting-edge design and implementation techniques for hardware security. This series is perfect for engineers and designers looking to strengthen their …
Today, we find ourselves at the nexus of the fourth industrial revolution — an era dominated by Smart Everything. The internet, artificial intelligence, and the use of software are helping to create things that couldn’t even be imagined just a decade or two ago. The opportunities seem limitless, and the potential for more world-changing technologies …
The digital chip design flow carries with it an enormous wealth of untapped information regarding the health and status of your SoC design. The ability to efficiently mine this data provides chip designers with comprehensive visibility and actionable insights to uncover PPA opportunities. This webinar will introduce you to Synopsys Design.da, the industry’s first comprehensive data-visibility …
Continue reading "Webinar: Maximize Productivity with Deep Insights into PPA Trajectories"
This webinar equips you with effective strategies to tackle randomization-related errors within your UVM verification environment. We'll explore the power of Cadence's Verisium Debug, a tool designed to simplify the debugging process. What You Will Learn Practical techniques for isolating and resolving randomization-related errors Optimize your UVM verification environment for robust functionality Gain valuable insights …
Continue reading "Webinar: Efficient Way to UVM Constraint Randomization Debug"
Leveraging functional patterns is crucial for achieving high defect coverage and reducing defective parts per million (DPPM) levels. Synopsys VC Z01X fault simulator offers enhanced fault coverage in manufacturing test flows, complementing ATPG tools like Synopsys TestMAX ATPG. In this presentation we will delve into unique coverage scenarios, such as resets and clocks blocked during ATPG mode. We'll …
Continue reading "Webinar: Enhancing Manufacturing Test Flows with Synopsys VC Z01X"
Summary Join us for a weekly webinar series focusing on cutting-edge design and implementation techniques for hardware security. This series is perfect for engineers and designers looking to strengthen their …
Join us for an exclusive webinar during Ansys 2024 R2 updates. We'll showcase significant enhancements to our Thermal Integrity tools. Discover the latest in Icepak, Mechanical Thermal, and Mechanical Structural, …
Continue reading "Ansys 2024 R2: Thermal Integrity in the Ansys Electronics Desktop Update"
