Electrical Rule Checking and Exhaustive Classification of Errors

Electrical Rule Checking and Exhaustive Classification of Errors
by Daniel Payne on 04-16-2024 at 10:00 am

Aniah tool flow min

The goal of SoC design teams is to tape-out their project and receive working silicon on the first try, without discovering any bugs in silicon. To achieve this lofty goal requires all types of specialized checking and verification during the design phase to prevent bugs. There are checks at the system level, RTL level, gate level,… Read More


Webinar: From Transistor to Wireless Communication – An End-to-End 5G/6G Workflow

Webinar: From Transistor to Wireless Communication – An End-to-End 5G/6G Workflow
by Admin on 10-11-2023 at 4:02 pm

Join us in the entire end-to-end workflow webinar as we unfold the design nuances of a Gallium Nitride (GaN) amplifier from a transistor model and its progression through comprehensive circuitry. Dive into Co-Simulation and multiphysics, ensuring a holistic approach to design and evaluation.

TIME:

NOVEMBER 8TH, 2023

9 AM EST

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69th Annual IEEE International Electron Devices Meeting

69th Annual IEEE International Electron Devices Meeting
by Admin on 09-25-2023 at 3:13 pm

IEEE International Electron Devices Meeting (IEDM) is the world’s preeminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling. IEDM is the flagship conference for nanometer-scale CMOS transistor technology,… Read More


Finding Transistor-level Defects Inside of Standard Cells

Finding Transistor-level Defects Inside of Standard Cells
by Daniel Payne on 01-31-2017 at 12:00 pm

In the earliest days of IC design the engineering work was always done at the transistor-level, and then over time the abstraction level moved upward to gate-level, cell-level, RTL level, IP reuse, and high-level modeling abstractions. The higher levels of abstraction have allowed systems to be integrated into an SoC that can… Read More


Starvision Pro: Lattice Semiconductor’s Experience

Starvision Pro: Lattice Semiconductor’s Experience
by Paul McLellan on 04-09-2015 at 7:00 am

During SNUG I took the opportunity to chat to Choon-Hoe Yeoh of Lattice Semiconductor about how they use Concept Engineering’s Starvision Pro product. He is the senior director of EDA tools and methodologies there.

Lattice Semiconductor is a manufacturer of low-power, small-footprint, low-cost programmable logic devices.… Read More


StarVision to Debug and Analyze Designs at All Levels

StarVision to Debug and Analyze Designs at All Levels
by Pawan Fangaria on 10-09-2014 at 4:00 pm

In today’s SoC world where multiple analog and digital blocks along with IPs at different levels of abstractions are placed together on a single chip, debugging at all levels becomes quite difficult and clumsy. While one is working at the top level and needs to investigate a particular connection at an intermediate hierarchical… Read More


Transistor-level Sizing Optimization

Transistor-level Sizing Optimization
by Daniel Payne on 08-29-2014 at 4:00 pm

RTL designers know that their code gets transformed into gates and cells by using a logic synthesis tool, however these gates and cells are further comprised of transistors and sometimes you really need to optimize the transistor sizing to reach power, performance and area goals. I’ve done transistor-level IC design before,… Read More


What Comes After FinFET?

What Comes After FinFET?
by Paul McLellan on 08-10-2014 at 11:01 pm

So what comes after FinFETs? At 14/16nm (or 22nm if you are Intel) we had FinFET transistors, where the channel was no longer planar but stuck out of the wafer vertically, and the gate wrapped around it on 3 sides. The key thing that made FinFET transistors attractive was that the channel was thin so that the gate controlled it well. … Read More


Mark your Date for Semiconductor Design Vision

Mark your Date for Semiconductor Design Vision
by Pawan Fangaria on 03-13-2014 at 4:30 am

A very popular acronym is ‘WYSIWYG’ – What You See Is What You Get! This is very true and is important to visualize things to make it better in various aspects such as aesthetics, compactness, organization, structure, understandable for correction and so on; the most important, in case of semiconductor design, is being able to identify… Read More


Parasitic Debugging in Complex Design – How Easy?

Parasitic Debugging in Complex Design – How Easy?
by Pawan Fangaria on 01-23-2014 at 9:00 am

When we talk about parasitic, we talk about post layout design further expanded in terms of electrical components such as resistances and capacitances. In the semiconductor design environment where multiple parts of a design from different sources are assembled together into highly complex, high density SoC, imagine how complex… Read More