Who protects power protection chips?

Who protects power protection chips?
by Tom Simon on 05-25-2016 at 12:00 pm

Power protection chips are widely used these days to protect sensitive circuitry from over-voltage and over-current stress. However, these workhorse chips are often subjected to extraordinary thermal stress themselves and need to be protected from burning up – literally.

Power protection chips work like electronic fuses,… Read More


A Complete Simulation Platform for Mobile Systems

A Complete Simulation Platform for Mobile Systems
by Pawan Fangaria on 08-23-2015 at 7:00 am

If we take an insight into the semiconductor industry, we can easily find that mobile systems are the main drivers of this industry. The Smartphone business has remained at the top since a good number of years. Although the Smartphone sales growth has started showing a sign of stagnation, it is still a main contributor with a solid… Read More


Don’t Miss Mentor Graphics U2U San Jose, April 21, 2015

Don’t Miss Mentor Graphics U2U San Jose, April 21, 2015
by Beth Martin on 04-16-2015 at 10:00 pm

Mentor Graphics’ User2User conference will be held next week on April 21[SUP]st[/SUP] at the San Jose DoubleTree Hotel. This one-day, free conference is the perfect opportunity to learn, network, and share with other Mentor Graphics users.

The day starts off with back-to-back keynotes that examine different aspects of the … Read More


FinFET Designs Need Early Reliability Analysis

FinFET Designs Need Early Reliability Analysis
by Pawan Fangaria on 02-19-2015 at 9:30 pm

In a world with mobile and IoT devices driven by ultra-low power, high performance and small footprint transistors, FinFET based designs are ideal. FinFETs provide high current drive, low leakage and high device density. However, a FinFET transistor is more exposed to thermal issues, electro migration (EM), and electrostatic… Read More


Solution for PI, TI & SI Issues in 3D-ICs

Solution for PI, TI & SI Issues in 3D-ICs
by Pawan Fangaria on 11-30-2014 at 7:00 pm

As we move towards packing more and more functionalities and increasing densities of SoCs, the power, thermal and signal integrity issues keep on rising. 3D-IC is a great concept to stack multiple dies on top of each other vertically. While it brings lot of avenues to package dies with multiple functions together, it has challenges… Read More


Noise & Reliability of FinFET Designs – Success Stories!

Noise & Reliability of FinFET Designs – Success Stories!
by Pawan Fangaria on 11-01-2014 at 7:00 am

I think by now there has been good level of discussion on FinFET technology at sub-20 nm process nodes and this is an answer to ultra dense, high performance, low power, and billion+ gate SoC designs within the same area. However, it comes with some of the key challenges with respect to power, noise and reliability of the design. A FinFET… Read More


ANSYS Tools Shine at FinFET Nodes!

ANSYS Tools Shine at FinFET Nodes!
by Pawan Fangaria on 09-30-2014 at 4:00 pm

In the modern semiconductor ecosystem we are seeing rapid advancement in technology breaking past once perceived limits; 28nm, 20nm, 16-14nm, 10nm and we are foreseeing 7nm now. Double and multi-patterning are already being seen along with complex FinFET structures in transistors to gain the ultimate advantages in PPA from… Read More


Electronic Thermal Management through Icepak

Electronic Thermal Management through Icepak
by Pawan Fangaria on 08-03-2014 at 8:30 pm

Last week my daughter was playing some games on my Google Nexus smartphone for a while when one of my friends called. When I picked up the phone, I couldn’t imagine it was so hot. There is no doubt; every electronic device today emits an order of magnitude higher heat than what it used to at most a decade ago. There is so much emphasis on … Read More


Temperature – The Fourth Aspect to Look at in SoC Design

Temperature – The Fourth Aspect to Look at in SoC Design
by Pawan Fangaria on 07-25-2014 at 2:00 pm

In my career in semiconductor industry, I can recall, in the beginning there was emphasis on design completion with automation as fast as possible. The primary considerations were area and speed of completion of a semiconductor design. Today, with unprecedented increase in multiple functions on the same chip and density of the… Read More


Two New ESL Tools for Power and Thermal at DAC

Two New ESL Tools for Power and Thermal at DAC
by Daniel Payne on 05-27-2014 at 6:47 pm

Gary Smith published a list of what to see at DAC, and I noticed that he listed DOCEA Power in a category of ESL Thermal. I’ll be meeting the DOCEA engineers on Wednesday at DAC to learn more about their two newest ESL products:

  • Thermal Profiler
  • Power Intelligence

In general DOCEA Power tools allow you to manage power and thermal… Read More