Power Integrity from 3DIC to Board

Power Integrity from 3DIC to Board
by Bernard Murphy on 09-14-2017 at 7:00 am

The semiconductor industry has built decades of success on hyper-integration to increase functionality and performance while also reducing system cost. But the standard way to do this, to jam more and more functionality onto a single die, breaks down when some of the functions you want to integrate are built in different processes.… Read More


Big Data and Power Integrity: Drilling Down

Big Data and Power Integrity: Drilling Down
by Bernard Murphy on 08-21-2017 at 7:00 am

I’ve written before about how Ansys applies big data analytics and elastic compute in support of power integrity and other types of analysis. A good example of the need follows this reasoning: Advanced designs today require advanced semiconductor processes – 16nm and below. Designs at these processes run at low voltages, much… Read More


Integrity and Reliability in Analog and Mixed-Signal

Integrity and Reliability in Analog and Mixed-Signal
by Bernard Murphy on 07-18-2016 at 1:30 pm

In the largest and fastest growing categories in electronics – mobile, IoT and automotive – analog is playing an increasingly important role. It’s important in delivering high integrity power and critical signals to the design though LDO regulators and PLLs, in managing high speed interfaces like DDR and SERDES, in interfacing… Read More


FinFETs, Power Integrity and Chip/Package Co-design

FinFETs, Power Integrity and Chip/Package Co-design
by Bernard Murphy on 02-18-2016 at 7:00 am

FinFETs have brought a lot of good things to design – higher performance, higher density and lower leakage power – promising to extend Moore’s law for a least a while longer. But inevitably with new advances come new challenges, especially around optimizing for power integrity in these designs.

One of these challenges is… Read More


Thermal Reliability and Power Integrity for IC Design

Thermal Reliability and Power Integrity for IC Design
by Daniel Payne on 09-14-2015 at 12:00 pm

When I designed DRAM chips at Intel back in the 1970’s we didn’t really know what the die temperature would be before taping out silicon, instead we waited for packaged parts to come back and then did our thermal measurements. IC designers today don’t have that luxury of taping out their new SoC without having … Read More


ANSYS Enters the League of 10nm Designs with TSMC

ANSYS Enters the League of 10nm Designs with TSMC
by Pawan Fangaria on 04-09-2015 at 7:00 pm

The way we are seeing technology progression these days is unprecedented. It’s just about six months ago, I had written about the intense collaboration between ANSYSand TSMCon the 16nm FinFET based design flow and TSMC certifying ANSYS tools for TSMC 16nm FF+ technology and also conferring ANSYS with “Partner of the Year” award.… Read More


ANSYS Tools Shine at FinFET Nodes!

ANSYS Tools Shine at FinFET Nodes!
by Pawan Fangaria on 09-30-2014 at 4:00 pm

In the modern semiconductor ecosystem we are seeing rapid advancement in technology breaking past once perceived limits; 28nm, 20nm, 16-14nm, 10nm and we are foreseeing 7nm now. Double and multi-patterning are already being seen along with complex FinFET structures in transistors to gain the ultimate advantages in PPA from… Read More


A Collaborative Approach Yields Better PI for PCBs

A Collaborative Approach Yields Better PI for PCBs
by Pawan Fangaria on 05-18-2014 at 10:30 am

The power integrity (PI) of a system is an extremely important aspect to be looked at all levels – chip, package and PCB for overall reliability of the system. At the PCB level, a DC analysis, usually based on IR drop, must ensure that adequate DC voltage, satisfying all constraints of current density and temperature, is delivered… Read More


LSI’s Way of Faster & Reliable Electronic System Design

LSI’s Way of Faster & Reliable Electronic System Design
by Pawan Fangaria on 05-05-2014 at 9:30 am

LSI Corporationstarted in 1980s and I had several encounters with it during my jobs in 1990s; not to forget the LSI chips I used to see in desktops and other electronic systems, and I’m happy to see LSI continuing today with more vigour having leadership position in storage and networking space. It provides highly reliable, high … Read More


Dual Advantage of Intelligent Power Integrity Analysis

Dual Advantage of Intelligent Power Integrity Analysis
by Pawan Fangaria on 02-03-2014 at 9:30 am

Often it is considered safer to be pessimistic in estimating IR-drop to maintain power integrity of semiconductor designs; however that leads to the use of extra buffering and routing resources which may not be necessary. In modern high speed, high density SoCs having multiple blocks, memories, analog IPs with different functionalities… Read More