IEEE S3S Rump Session: “What Does IoT Mean for Si Technology?”

IEEE S3S Rump Session: “What Does IoT Mean for Si Technology?”
by khaki on 09-20-2015 at 12:00 pm

For the second year in the row, Gartner’s Emerging Technologies Hype Cycle puts Internet of Things (IoT) at the Peak of Inflated Expectations. Not only many online forums are inflated with debates on IoT-related topics, but more importantly virtually all semiconductor companies made announcement pertaining their plans to … Read More


My Tryst with Semiconductors and EDA

My Tryst with Semiconductors and EDA
by Pawan Fangaria on 08-19-2015 at 4:00 pm

Yes, today I realize it feels like a tryst with semiconductors. In actual meaning; it wasn’t a love affair with semiconductors, but I must say the greatest thing it taught me about how it approaches towards perfection. And that became the guiding principle in my life; how can I do something better. Of course nothing is perfect in life… Read More


My Candid Conversation with Karen Bartleson

My Candid Conversation with Karen Bartleson
by Pawan Fangaria on 08-16-2015 at 7:30 am

If you don’t know about Karen Bartleson, before I get into details, let me tell you that she was the President of IEEE-SA for the past 2 years and has been nominated by the IEEE Board of Directors as one of the candidates for IEEE President-Elect for 2016. The IEEE is an organization I admire as it plays a key role in advancing technology… Read More


Power Management Gets Tricky in IP Driven World

Power Management Gets Tricky in IP Driven World
by Pawan Fangaria on 07-08-2015 at 7:00 pm

Today, an SoC can have multiple instances of an IP and also instances of many different IPs from different vendors. Every instance of an IP can work in a separate mode and requires a dedicated power arrangement which may only be formalized at the implementation stage. The power intent, if specified earlier, will need to be re-generated… Read More


Physically Aware DFT Improves PPA

Physically Aware DFT Improves PPA
by Pawan Fangaria on 02-16-2015 at 7:00 pm

Introducing on-chip test circuitry has become a necessary criteria for an ASIC’s post manufacture testability. The test circuitry is usually referred as DFT (Design-for-Test) circuit. A typical methodology for introducing DFT circuit in a design is to replace usual flip-flops with special types of flip-flops called ‘sc… Read More


A Comprehensive Automated Assertion Based Verification

A Comprehensive Automated Assertion Based Verification
by Pawan Fangaria on 02-13-2015 at 4:00 pm

Using an assertion is a sure shot method to detect an error at its source, which may be buried deep within a design. It does not depend on a test bench or checker, and can fire automatically as soon as a violation occurs. However, writing assertions manually is very difficult and time consuming. To do so require deep design and coding… Read More


Measuring Metastability

Measuring Metastability
by Jerry Cox on 01-24-2015 at 7:00 am

Measuring metastability is just 50 years old this year. In 1965 my colleague Tom Chaney took a sampling ‘scope picture of an ECL flip-flop going metastable. S. Lubkin had made mention of the phenomenon over a decade before that, but at that time most engineers were unaware of the phenomenon or did not believe it actually existed. … Read More


Its a bouncing baby IEEE standard!

Its a bouncing baby IEEE standard!
by Beth Martin on 11-04-2014 at 12:00 am

Pass the cigars! On November 3rd, 2014, the IEEE-SA Standards Board finally approved IEEE P1687 as a new standard. From now on, you can drop the “P” and just call it 1687, or to its friends, IJTAG. Now would be a good time to sign up for an IJTAG technical workshop.

The new IEEE 1687 Internal JTAG (IJTAG) standard is changing… Read More


SEMI Breakfast Forums: the Internet of Things

SEMI Breakfast Forums: the Internet of Things
by Paul McLellan on 03-21-2014 at 4:29 pm

Coming up on April 10th is the SEMI Silicon Valley Breakfast Forum Internet of Things—Driving the Microelectronics Revolution. It runs from 7am to 10.45am and will be held at SEMI Headquarters which is at 3081 Zanker Road in San Jose.

Widespread adoption of the Internet of Things will take time, but the movement is advancing thanks… Read More


Grid Vision 2050 – Unified & Open Across The Globe

Grid Vision 2050 – Unified & Open Across The Globe
by Pawan Fangaria on 02-02-2014 at 10:30 am

Whenever there is good momentum in a particular technology, IEEEtakes major initiative to standardize the procedures, formats, methods, measurements etc. involved in the technology to proliferate it for the advantage of wider community. And that becomes successful by active participation and collaboration of both producers… Read More