Leading Edge Logic Landscape 2018

Leading Edge Logic Landscape 2018
by Scotten Jones on 03-16-2018 at 2:00 pm

The most viewed blogs I write for SemiWiki are consistently blogs comparing the four leading edge logic producers, GLOBALFOUNDRIES (GF), Intel, Samsung (SS) and TSMC. Since the last time I compared the leading edge new data has become available and several new processes have been introduced. In this blog I will update the current… Read More


SPIE Advanced Lithography 2018 – EUV Status

SPIE Advanced Lithography 2018 – EUV Status
by Scotten Jones on 03-05-2018 at 7:00 am

This year the Advanced Lithography Conference felt very different to me than the last couple of years. I think it was Chris Mack who proclaimed it the year of Stochastics. EUV has dominated the conference for the last several years but in the past the conversation has been mostly centered on the systems, system power and uptime.

I … Read More


LithoVision 2018 The Evolving Semiconductor Technology Landscape and What it Means for Lithography

LithoVision 2018 The Evolving Semiconductor Technology Landscape and What it Means for Lithography
by Scotten Jones on 02-25-2018 at 5:00 pm

I was invited to present at Nikon’s LithoVision event held the day before the SPIE Advanced Lithography Conference in San Jose. The following is a write up of the talk I gave. In this talk I discuss the three main segments in the semiconductor industry, NAND, DRAM and Logic and how technology transitions will affect lithography.… Read More


IEDM 2017 – Leti Gate-All-Around Stacked-Nanowires

IEDM 2017 – Leti Gate-All-Around Stacked-Nanowires
by Scotten Jones on 02-12-2018 at 12:00 pm

At IEDM in December I had a chance to interview Thomas Ernst about the paper “Performance and Design Considerations for Gate-All-around Stacked-NanoWires FETs” by Leti and STMicroelectonics.

Leti published the first stacked nanowire in 2006, it was very new then, now stacked nanowire/nanosheets are starting… Read More


IEDM 2017 – Controlling Threshold Voltage with Work Function Metals

IEDM 2017 – Controlling Threshold Voltage with Work Function Metals
by Scotten Jones on 01-26-2018 at 7:00 am

As I have said many times, IEDM is one of the premier conferences for semiconductor technology. On Sunday before the formal conference started I took the “Boosting Performance, Ensuring Reliability, Managing Variation in sub-5nm CMOS” short course. The second module in the course was “Multi-Vt Engineering… Read More


ISS 2018 – The Impact of EUV on the Semiconductor Supply Chain

ISS 2018 – The Impact of EUV on the Semiconductor Supply Chain
by Scotten Jones on 01-18-2018 at 8:00 am

I was invited to give a talk at the ISS conference on the Impact of EUV on the Semiconductor Supply Chain. The ISS conference is an annual gathering of semiconductor executives to review technology and global trends. In this article I will walk through my presentation and conclusions.… Read More


Deep Learning and Cloud Computing Make 7nm Real

Deep Learning and Cloud Computing Make 7nm Real
by Daniel Nenni on 11-05-2017 at 7:00 am

The challenges of 7nm are well documented. Lithography artifacts create exploding design rule complexity, mask costs and cycle time. Noise and crosstalk get harder to deal with, as does timing closure. The types of applications that demand 7nm performance will often introduce HBM memory stacks and 2.5D packaging, and that creates… Read More


Arm TechCon Preview with the Foundries!

Arm TechCon Preview with the Foundries!
by Daniel Nenni on 10-23-2017 at 9:00 am

This week Dr. Eric Esteve, Dr. Bernard Murphy, and I will be blogging live from Arm TechCon. It really looks like it will be a great conference so you should see some interesting blogs in the coming days. One of the topics I am interested in this year is foundation IP and I will tell you why.

During the fabless transformation of the semiconductor… Read More