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Mentor Graphics User2User Conference

Mentor Graphics User2User Conference
by glforte on 04-05-2013 at 1:06 pm


April 25, 2013, San Jose, CA

Click here to register.

Come hear Mentor Graphics CEO, Wally Rhines, 2013 Kaufman Award Winner,Chenming Hu, and Xilinx Senior VP,Victor Peng, at the User2User Conference in San Jose.

KEYNOTES
Organizing by Design
9:00am – 9:50am
Walden C. Rhines | CEO & Chairman | Mentor Graphics
Winning products… Read More


For power and performance, Fins or BOXes?

For power and performance, Fins or BOXes?
by Beth Martin on 04-05-2013 at 12:50 pm

I recently spoke to Arvind Narayanan, Product Marketing Manager for Mentor’s place and route division about emerging technology. This of course led to FinFETS, FDSOI, performance, power, and cost-benefit. The battle between FDSOI and FinFETs, said Narayanan, is going to be something to watch.

Both FDSOI and FinFET technologies… Read More


RTL Restructuring

RTL Restructuring
by Daniel Payne on 04-04-2013 at 2:34 pm

Hierarchical IC design has been around since the dawn of electronics, and every SoC design today will use hierarchy for both the physical and logical descriptions. During the physical implementation of an SoC you will likely run into EDA tool limits that require a re-structure of the hierarchy. This re-partitioning will cause… Read More


Kathryn Kranen Wins UBM Lifetime Achievement Award 2013

Kathryn Kranen Wins UBM Lifetime Achievement Award 2013
by Paul McLellan on 04-03-2013 at 6:54 pm

UBM’s EETimes and EDN today announced Kathryn Kranen as the lifetime achievement award winner for this years ACE awards program. Kathryn, of course, is the CEO of Jasper (and is also currently the chairman of EDAC). Past winners exemplify the prestige and significance of the award. Since 2005 the award was given to Gordon… Read More


Cell Level Reliability

Cell Level Reliability
by Paul McLellan on 04-03-2013 at 6:06 pm

I blogged last month about single event effects (SEE) where a semiconductor chip behaves incorrectly due to being hit by an ion or a neutron. Since we live on a radioactive planet and are bombarded by cosmic rays from space, this is a real problem, and it is getting worse at each process node. But just how big of a problem is it?


TFIT is … Read More


Rare earth syndrome: PHY IP analogy

Rare earth syndrome: PHY IP analogy
by Eric Esteve on 04-03-2013 at 10:34 am

If you ask to IP vendors selling functions, PHY or Controller, supporting Interface based protocols which part is the master piece, the controller IP only vendors will answer: certainly my digital block, look how complex it has to be to support the transport and logical part of the protocol! Just think about the PCI Express gen-3Read More


Phil Kaufman Award Recipient 2013: Chenming Hu

Phil Kaufman Award Recipient 2013: Chenming Hu
by Paul McLellan on 04-03-2013 at 2:15 am

This year’s recipient of the Kaufman Award is Dr Chenming Hu. I can’t think of a more deserving recipient. He is the father of the FinFET transistor which is clearly the most revolutionary thing to come along in semiconductor for a long time. Of course he wasn’t working alone but he was the leader of the team at UC… Read More


TSMC to Talk About 10nm at Symposium Next Week

TSMC to Talk About 10nm at Symposium Next Week
by Daniel Nenni on 04-02-2013 at 8:05 pm

Given the compressed time between 20nm and 16nm, twelve months versus the industry average twenty four months, it is time to start talking about 10nm, absolutely. Next Tuesday is the 19th annual TSMC Technology Symposium keynoted of course by the Chairman, Dr. Morris Chang.

Join the 2013 TSMC Technology Symposium. Get the latest
Read More


Intelligent tools for complex low power verification

Intelligent tools for complex low power verification
by Pawan Fangaria on 04-02-2013 at 8:05 pm

The burgeoning need of high density of electronic content on a single chip, thereby necessitating critical PPA (Power, Performance, Area) optimization, has pushed the technology node below 0.1 micron where static power becomes equally relevant as dynamic power. Moreover, multiple power rails run through the circuit at different… Read More


What really means high reliability for OTP NVM?

What really means high reliability for OTP NVM?
by Eric Esteve on 04-02-2013 at 4:04 am

Normal operation range for a Semiconductor device is not made equal for systems… If you consider a CPU running inside an aircraft engine control system, this device should operate at temperature ranged between -55°C and +125°C, when an Application Processor for smartphone is only required to operate in the 0°C to +70°C range. … Read More