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bkeppens
Received Engineer degree in Electronics from Groep T, Leuven in 1996. His master thesis, together with his colleague Steven Servaes, ‘Transmission Line Pulsing (TLP) technique for analyzing ESD reliability’, performed at IMEC, Leuven, Belgium, received the BARCO-award for best Industrial Engineer thesis in 1996.
In 1996 Bart joined Imec and was responsible for device electrical characterization, support for the ESD group and for the Non Volatile Memories group for layout and testing.
From May 2002 he joined Sarnoff Europe, Belgium, solving ESD related problems for customers worldwide, first as ESD engineer, later as technical leader, ESD design specialist. From 2006, Bart supports the Business Development initiatives as Technical Director for ESD.
After a management buy-out in June 2009, Sarnoff Europe became 'SOFICS - Solutions for ICs' where Bart is Director Technical Marketing working with semiconductor companies worldwide.
Bart (co-) authored 40 peer-reviewed published articles in the field of ‘on-chip ESD protection and testing’ and ‘Non Volatile Memories’. Invited papers on ESD solutions and TLP analysis techniques have been delivered at the RCJ ESD symposium in Japan in 2006, 2007, 2008 and 2009. He is member of the Technical Program Committee (‘TPC’) of the EOS/ESD symposium since 2003 and member of the ESREF TPC in 2003, 2005, 2007, 2009 and 2010. Bart acted as a Workshop Panelist on ESD during various conferences (EOS/ESD Symposium and RCJ) and presented an invited tutorial at Taiwan ESD conference in 2008 and 2012. Bart holds several on-chip ESD protection design patents.