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Webinar: Avoid Costly Silicon Respins: Maximize Reliability and Yield with Advanced Noise and Binning Modeling
October 15 @ 10:00 AM - 11:00 AM
Join Keysight for a comprehensive session focused on enhancing device reliability and preventing costly silicon respins through innovative noise and binning modeling technologies.
Enhancing Reliability with Accurate Noise Measurement and Modeling
Accurately accounting for noise is essential for ensuring reliability of complex semiconductor devices. Explore how noise data across the wafer serves as an early indicator of device performance, particularly in low-signal applications such as communications circuits, quantum computing, and image processing. Learn how Keysight’s Advanced Low-Frequency Noise Analysis system measures and analyzes 1/f and Random Telegraph Noise from DC to 100MHz, enabling you to refine designs and boost overall reliability.
Streamlining Binning Model Extraction to Avoid Costly Respins
Learn how to streamline your device modeling workflow and avoid expensive silicon respins with automated binning model extraction. As devices become smaller and more complex, traditional global models often fall short in accuracy. Binning models offer improved precision but can be difficult and time-consuming to develop. Keysight will present automation techniques and fast QA methods to simplify and accelerate the binning process.
Who Should Attend:
• Device modeling engineers
• RF/microwave engineers
• Foundry and design house professionals
What You Will Learn:
• The impact of precise noise modeling on device reliability and performance
• How to improve noise data integration and analysis
• Automating binning model extraction to avoid costly respins and enhance modeling efficiency
• Streamlining the QA process and accelerating model development
Discover how advanced modeling techniques improve device reliability and prevent costly design errors.
SPEAKERS: Craig Domeny is a Customer Service Specialist with extensive experience in electronic design and development. Sherry Lyu is a Solution Engineer supporting Keysight’s device modeling tools with prior experience working in a silicon foundry.
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