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Q2FY24TessentAI 800X100
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Merger Mania: The Future of the Semiconductor Industry

Merger Mania: The Future of the Semiconductor Industry
by Pawan Fangaria on 11-12-2015 at 12:00 pm

In a semiconductor industry which appears maturing, we are also seeing the technologies unravelling newer transistor structures, memories, processors, and newer ways of designing ICs and electronic systems. The present decade appears to be at the cusp of a new transformation in the semiconductor industry. Amid a slew of mergers… Read More


How Virtualization Makes Network Processor Verification Efficient

How Virtualization Makes Network Processor Verification Efficient
by Tom Simon on 10-22-2015 at 7:00 am

When Ethernet was introduced in 1983 it ran at 10Mbps and mostly relied on hubs and coaxial cable. Twelve years later a faster speed was introduced, running at 100Mbps. Since then we have seen an acceleration of new data rate introductions. According top the Ethernet Alliance, Ethernet could have 12 speeds before 2020, with 6 of … Read More


Price of Admission $0.00 at Inaugural Silicon Valley Conference

Price of Admission $0.00 at Inaugural Silicon Valley Conference
by Beth Martin on 10-20-2015 at 7:00 am

Back in 2002, the Southwest DFT Conference was born and experts on design for test (DFT) and test got together to share ideas and talk to people in this industry that were trying to solve test challenges of the day.… Read More


IoT chipsets and enterprise emulation tools

IoT chipsets and enterprise emulation tools
by Don Dingee on 10-16-2015 at 12:00 pm

When most people talk about the IoT, it is usually all about wearables-this and low-power-that – because everyone is chasing the next huge consumer post-mobile device market. Mobile devices have provided the model. The smartphone is the on-ramp to the IoT for most consumers, with Bluetooth, Wi-Fi, and LTE, and maybe a dozen or … Read More


Meeting DFM Challenges with Hierarchical Fill Data Insertion

Meeting DFM Challenges with Hierarchical Fill Data Insertion
by Tom Dillinger on 10-11-2015 at 12:00 pm

To describe the latest methodology for the addition of Design for Manufacturability fill shapes to design layout data, it’s appropriate to borrow a song title from Bob Dylan – The Times They Are A Changin’. The new technical requirements are best summarized as: “The goal is now to add as much fill as possible, which (ideally) looksRead More


Something Old, Something New…EDA and Verification

Something Old, Something New…EDA and Verification
by Ellie Burns on 10-04-2015 at 12:00 pm

When I got the opportunity to blog about verification, I thought, what new and interesting things should I talk about? Having started my EDA career in 1983, I often feel like one of the “oldies” in this business…remember when a hard drive required a static strap, held a whopping 33 MB, and was the size of a brick? Perhaps they should … Read More


What’s Testing Design Limits at ITC?

What’s Testing Design Limits at ITC?
by Beth Martin on 10-02-2015 at 12:00 pm

The 46[SUP]th[/SUP] IEEE International Test Conference (ITC) will be held the week of October 5, 2015 at the Disneyland Hotel Conference Center in Anaheim, California. ITC is where you will discover the latest ideas and learn about practical applications of test technologies.

As you take in panels, tutorials, presentations,… Read More


Top 10 Reasons to invest in Interactive Design Rule Checking tools

Top 10 Reasons to invest in Interactive Design Rule Checking tools
by Tom Dillinger on 10-01-2015 at 12:00 pm

One of the most energetic presentations at the recent TSMC OIP 2015 symposium was given by Tom Williams from Qualcomm, who shared his insights (and enthusiasm!) for Mentor’s Calibre RealTime interactive Design Rule Checking (iDRC) product.

Paraphrasing Tom’s presentation (and with a tip of the hat to David Letterman), here … Read More


Together At Last—Combining Netlist and Layout Data for Power-Aware Verification

Together At Last—Combining Netlist and Layout Data for Power-Aware Verification
by Beth Martin on 09-25-2015 at 12:00 pm

The market demanded that gadgets it loves become ever more conscious of their power consumption, and chip designers responded with an array of clever techniques to cut IC power use. Unsurprisingly, these new techniques added to the complexity of IC verification. When you’re verifying a design that has 100+ separate power domains,… Read More