WP_Term Object
(
    [term_id] => 43
    [name] => Magwel
    [slug] => magwel
    [term_group] => 0
    [term_taxonomy_id] => 43
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 28
    [filter] => raw
    [cat_ID] => 43
    [category_count] => 28
    [category_description] => 
    [cat_name] => Magwel
    [category_nicename] => magwel
    [category_parent] => 157
    [is_post] => 
)
            
WP_Term Object
(
    [term_id] => 43
    [name] => Magwel
    [slug] => magwel
    [term_group] => 0
    [term_taxonomy_id] => 43
    [taxonomy] => category
    [description] => 
    [parent] => 157
    [count] => 28
    [filter] => raw
    [cat_ID] => 43
    [category_count] => 28
    [category_description] => 
    [cat_name] => Magwel
    [category_nicename] => magwel
    [category_parent] => 157
    [is_post] => 
)

HBM or CDM ESD Verification – You Need Both

HBM or CDM ESD Verification – You Need Both
by Tom Simon on 07-11-2019 at 11:00 am

In the realm of ESD protection, Charged Device Model (CDM) is becoming the biggest challenge. Of course, Human Body Model (HBM) is still essential, and needs to be used when verifying chips. However, a number of factors are raising the potential losses that CDM events can cause relative to HBM. These factors fall into two categories:… Read More


Upcoming HBM and CDM ESD Verification Seminar in Taiwan

Upcoming HBM and CDM ESD Verification Seminar in Taiwan
by Tom Simon on 06-25-2019 at 10:00 am

The electrostatic discharge that occurs in lightening, as seen in the picture below, can cause serious damage to the objects on the ground. Over centuries mankind has devised ways, such as lighting rods and arresters, to deflect the energy so it is dissipated harmlessly. The same drama plays out on modern semiconductors due to … Read More


A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation

A Practical Approach to Modeling ESD Protection Devices for Circuit Simulation
by Tom Simon on 06-03-2019 at 8:00 am

Lurking inside of every Mosfet is a parasitic bipolar junction transistor (BJT). Of course, in normal circuit operation the BJT does not play a role in the device operation. Accordingly, SPICE models for Mosfets do not behave well when the BJT is triggered. However, these models work just fine for most purposes. The one important… Read More


Coupled Electro-thermal Analysis Essential for PowerMOS Design

Coupled Electro-thermal Analysis Essential for PowerMOS Design
by Tom Simon on 11-08-2018 at 12:00 pm

Power device designers know that when they see a deceptively simple pair of PowerMOS device symbols in the output stage of a power converter circuit schematic, they are actually looking at a massively complex network of silicon and metal interconnect. The corresponding physical devices can have a total device W on the order of … Read More


Verifying ESD Fixes Faster with Incremental Analysis

Verifying ESD Fixes Faster with Incremental Analysis
by Tom Simon on 08-23-2018 at 12:00 pm

The author of this article, Dündar Dumlugöl, is CEO of Magwel. He has 25 years of experience in EDA managing the development of leading products used for circuit simulation and high-level system design.

Every designer knows how tedious it can be to shuttle back and forth between their layout tool and analysis tools. Every time an… Read More


Converter Circuit Optimization Gets Powerful New Tool

Converter Circuit Optimization Gets Powerful New Tool
by Tom Simon on 05-09-2018 at 12:00 pm

DC converter circuit efficiency can have a big effect on the battery life of mobile devices. It also can affect power efficiency for wall-power operated circuits. Even before parasitics are factored in, converter circuit designers have a lot of issues to contend with. Optimizing circuit operation is essential for giving consumers… Read More


Snapback behavior determines ESD protection effectiveness

Snapback behavior determines ESD protection effectiveness
by Tom Simon on 12-14-2017 at 12:00 pm

Terms like avalanche breakdown and impact ionization sound like they come from the world of science fiction. They do indeed come from a high stakes world, but one that plays out over and over again here and now, on a microscopic scale in semiconductor devices – namely as part of electrostatic discharge (ESD) protection. Semiconductor… Read More


SRAM Optimization Saves Power on SOC’s and in Systems

SRAM Optimization Saves Power on SOC’s and in Systems
by Tom Simon on 03-21-2017 at 12:00 pm

Mobile device designers face the dilemma of reducing power and at the same time maintaining or increasing performance. Consumers will not tolerate increased battery life at the expense of performance. If it were otherwise, designers could simply dial back clock rates. Without this simple cure, the best way to reduce power for… Read More


On-Chip Power Distribution Networks Get Help from Magwel’s RNi

On-Chip Power Distribution Networks Get Help from Magwel’s RNi
by Tom Simon on 02-02-2017 at 12:00 pm

Counting squares is a useful tool for calculating simple resistance in wires, but falls short in reality when wires deviate from ideal. Frequently the use of RC extraction tools for determining resistance in signal lines in digital designs can be effective and straightforward. However, there are classes of nets in designs that… Read More


CEO Interview: Dündar Dumlugöl of Magwel

CEO Interview: Dündar Dumlugöl of Magwel
by Tom Simon on 12-19-2016 at 7:00 am

Magwel CEO Dündar Dumlugöl is well known from his days at Cadence, where I first met him, and for his more recent tenure at Magwel. At Cadence he led the team that first developed Spectre. He has come a long way from the start of his career at IMEC in Belgium. He and I had a chance to have a conversation recently where he offered insights … Read More