Transaction-based Emulation

Transaction-based Emulation
by Paul McLellan on 08-14-2014 at 7:01 am

Verification has been going through a lot of changes in the last couple of years. Three technologies that used to be largely contained in their own silos have come together: simulation, emulation and virtual-platforms.

Until recently, the workhorse verification tool was simulation. Emulation had its place but limits on capacity… Read More


eSilicon and the Ten Minute Quote

eSilicon and the Ten Minute Quote
by Paul McLellan on 08-01-2014 at 8:01 am

One of the challenges in bringing a design into production is getting a quote that includes all the various stages of the process. The quote cycle typically takes a couple of weeks. It is also pretty wasteful. A typical design might be quoted by 3 manufacturers and so 2 out of 3 quotes are wasted expense because the design is lost to a … Read More


Making IP Reuse and SoC Integration Easier

Making IP Reuse and SoC Integration Easier
by Daniel Payne on 07-31-2014 at 2:00 pm

The last graphics chip that I worked on at Intel was functionally simulated with only a tiny display size of 16×16 pixels, because that size allowed a complete regression test to be simulated overnight. Our team designed three major IP blocks: Display Processor, Graphics Processor and Bus Interface Unit. We wanted to also… Read More


Catching IC Manufacturing Defects With Slack-Based Transition Delay Testing

Catching IC Manufacturing Defects With Slack-Based Transition Delay Testing
by Daniel Payne on 07-16-2014 at 3:00 pm

Test engineers are often the unsung heroes in the semiconductor world, because they have the tough job of deciding if each IC is good or bad, while taking the least amount of time on a tester and ensuring that the tests are actually finding and uncovering all manufacturing and process variation defects. Simple stuck-at fault models… Read More


Modeling and Analysis of Single Event Effects (SEE)

Modeling and Analysis of Single Event Effects (SEE)
by Daniel Payne on 07-08-2014 at 4:00 pm

Single Event Effects (SEE) are important because we depend upon our consumer, industrial and aerospace products to work reliably. Protons, electrons, neutrons, or alpha particles may perturb the MOS or bipolar device operation in either a destructive or non-destructive fashion. Galactic cosmic rays are one source of these… Read More


Single Event Upsets

Single Event Upsets
by Paul McLellan on 06-25-2014 at 5:04 pm

Do you know what a SEE is? It stands for single event upset. We live on a radioactive planet which is also bombarded with cosmic rays, so particles are bombarding our chips. The materials used in packaging also can create particles that cause problems, even the solder. Reliability and aging has been an area that has not been at the forefront… Read More


Full-Custom Low Power Design Methodology

Full-Custom Low Power Design Methodology
by Daniel Payne on 05-19-2014 at 1:30 pm

Digital designers have used logic optimization and logic synthesis for decades as a means to produce more optimal designs with EDA tools. On the analog and transistor-level side of design the efforts to automatically optimize for speed or power have generally been limited to circuits with only a handful of transistors. These … Read More


Learning an HDL Simulator

Learning an HDL Simulator
by Daniel Payne on 04-23-2014 at 1:52 am

Learning an HDL language or an HDL simulator are two different things, so I wanted to see what was available for learning a vendor-specific HDL simulator. I’ve already taught Verilog as an instructor using both ModelSim and Active-HDL simulators, however we only used a handful of commands in the class and labs in order to … Read More


Addressing MCU Mixed Signal Design Challenges

Addressing MCU Mixed Signal Design Challenges
by Daniel Payne on 04-09-2014 at 2:23 pm

The emerging market for IoT and wearable devices are designed with mixed-signal IP that includes: embedded CPU, flash, analogue and radio.EDA and IP companies have recently worked together to allow us to design an MCU with mixed-signal IP blocks more efficiently. This morning I attended a webinar with presenters from ARMand Read More


Early RTL Power Analysis and Reduction

Early RTL Power Analysis and Reduction
by Daniel Payne on 03-26-2014 at 4:48 pm

Power analysis and reduction for SoC designs is a popular topic because of our consumer electronics dominated economy, and the need to operate devices on a battery source for the maximum time before a recharge. Just from my desk I can see multiple battery-powered devices: Laptop, tablet, smart phone, e-book reader, bluetooth … Read More