We are holding a FREE virtual workshop course for automotive OEM, suppliers and semiconductor industry professionals who want to better understand the software solutions available to help them comply with ISO26262 when going from chip to vehicle system.
TIME:
SEPTEMBER 5, 2024
9:30 AM – 4:30 PM CET
Venue:
Virtual
September 17 and 24, 2024, 15:00 – 16:00 (CEST) | Join the webinar live or watch it later on demand
Join our engaging webinar series on blue GIS technology, tailored for professionals eager to understand the intersection of technology and sustainable energy systems. Dive into the fundamentals and advanced features of blue
September 17 and 24, 2024, 15:00 – 16:00 (CEST) | Join the webinar live or watch it later on demand
Join our engaging webinar series on blue GIS technology, tailored for professionals eager to understand the intersection of technology and sustainable energy systems. Dive into the fundamentals and advanced features of blue
Join us as we delve into the simulation of the dark count rate (DCR) in silicon SPADs using Ansys Lumerical CHARGE. Participants will learn about the workflow for simulating the electric field and thermal generation rates, followed by calculating the avalanche triggering probability and DCR.
TIME:
AUGUST 22, 2024
SESSION 1:
Join us for an in-depth exploration of our advanced NVH (Noise, vibration, and harshness) solutions. This webinar will showcase Ansys’s advanced technologies and tools to help engineers tackle complex NVH challenges quickly and precisely.
TIME:
AUGUST 21, 2024
11:00 AM – 12:00 PM (EDT)
Venue:
Virtual
Join us for an in-depth, hands-on workshop on Electromagnetic Compatibility (EMC) simulation, designed to help engineers integrate powerful simulation tools into their workflow for improved product design and regulatory compliance.
TIME:
AUGUST 20, 2024
11 AM TO 1 PM EDT
Venue:
Virtual
Electromagnetic Compatibility
This webinar covers how Ansys solutions address battery management challenges and complexities: model-based functional safety analysis and safety-critical BMS software development, BMS integration, and validation.
TIME:
JULY 31, 2024
9 AM EDT
Venue:
Virtual
A reliable and safe battery design requires a battery
Failure and Yield Analysis is an increasingly difficult and complex process. Today, engineers are required to locate defects on complex integrated circuits. In many ways, this is akin to locating a needle in a haystack, where the needles get smaller and the haystack gets bigger every year. Engineers are required to understand… Read More
Semiconductor and integrated circuit developments continue to proceed at an incredible pace. The industry as a whole has gotten to this point of incredible complexity through the process of countless breakthroughs and developments in wafer fab processing. Today’s wafer fab contains some of the most complex and intricate… Read More
Semiconductor and integrated circuit developments continue to proceed at an incredible pace. For example, today’s application-specific ICs and microprocessors can contain upwards of 100 million transistors. Traditional testing relies on the stuck-at-fault (SAF) to model defect behavior. Unfortunately, the SAF… Read More
