Complete SoC Debugging & Integration in a Single Cockpit

Complete SoC Debugging & Integration in a Single Cockpit
by Pawan Fangaria on 11-15-2014 at 10:00 am

These days it’s common to expect large digital designs, analog blocks, custom IPs, glue logic, interfaces and interconnects all developed separately, perhaps by different vendors / teams, but integrated together in a single environment forming an SoC. The SoC can have multiple clock domains and can work in multiple modes of … Read More


Can Android1 Lead the Way for Google in New Smartphone Market?

Can Android1 Lead the Way for Google in New Smartphone Market?
by Pawan Fangaria on 11-12-2014 at 7:00 pm

I had been wanting to write about it since Google’sbig bang announcement of Android1 in India in Sep this year and their associated strategy to capture some of the large pockets of Smartphone market within a matured or declining cell phone market and maturing overall market of Smartphone. Since I wrote my last article hereon maturation… Read More


Noise & Reliability of FinFET Designs – Success Stories!

Noise & Reliability of FinFET Designs – Success Stories!
by Pawan Fangaria on 11-01-2014 at 7:00 am

I think by now there has been good level of discussion on FinFET technology at sub-20 nm process nodes and this is an answer to ultra dense, high performance, low power, and billion+ gate SoC designs within the same area. However, it comes with some of the key challenges with respect to power, noise and reliability of the design. A FinFET… Read More


Silvaco at the TSMC 2014 Open Innovation Platform

Silvaco at the TSMC 2014 Open Innovation Platform
by Daniel Payne on 10-31-2014 at 7:00 am

The success of our semiconductor eco-system depends on collaboration, so the annual TSMC OIP Event just held on September 30 at the San Jose Convention Center was a prime example of that. I didn’t attend this year, but I did follow up with Amit Nandaof Silvaco this week to hear about what they presented. As a consultant I’ve… Read More


StarVision to Debug and Analyze Designs at All Levels

StarVision to Debug and Analyze Designs at All Levels
by Pawan Fangaria on 10-09-2014 at 4:00 pm

In today’s SoC world where multiple analog and digital blocks along with IPs at different levels of abstractions are placed together on a single chip, debugging at all levels becomes quite difficult and clumsy. While one is working at the top level and needs to investigate a particular connection at an intermediate hierarchical… Read More


SiC and Si Power Devices

SiC and Si Power Devices
by Daniel Payne on 09-27-2014 at 7:00 am

ICs for consumer electronics are often battery powered, which are considered low voltage designs. On the other end of the IC spectrum are high voltage devices used in many industrial applications like: automotive, aerospace, data centers, transportation and power generation. … Read More


Coverage Driven Verification for Analog?

Coverage Driven Verification for Analog?
by Pawan Fangaria on 09-26-2014 at 1:00 am

We know there is a big divide between analog and digital design methodologies, level of automation, validation and verification processes, yet they cannot stay without each other because any complete system on a chip (SoC) demands them to be together. And therefore, there are different methodologies on the floor to combine analog… Read More


TCAD to SPICE

TCAD to SPICE
by Paul McLellan on 09-21-2014 at 7:00 am

Power devices have historically been made from silicon (Si), which has reached the limit of electric power loss reduction. With the superior physical and electrical properties of silicon carbide (SiC), we can expect to see a significant expansion in the amount of electric power conversion of electrical equipment as well as reduced… Read More


Expert Tool to View and Debug Design Issues at Spice Level

Expert Tool to View and Debug Design Issues at Spice Level
by Pawan Fangaria on 09-12-2014 at 7:00 am

Spice view of a design, block or fragment of the design is probably the lowest level of functional description of a circuit in terms of transistors, resistors, capacitors, interconnect and so on, which in several ways acts as an ultimate proof of pudding for any semiconductor design before manufacturing. However, it’s generally… Read More


A Comprehensive Power Analysis Solution for SoC+Package

A Comprehensive Power Analysis Solution for SoC+Package
by Pawan Fangaria on 09-08-2014 at 4:00 pm

Since power has become a critical factor in semiconductor chip design, the stress is towards decreasing supply voltage to reduce power consumption. However, the threshold voltage to switch devices cannot go down beyond a certain limit and these results in an extremely narrow margin for noise between the two. And that gets further… Read More